Cleaning in an HDI World
Electronic assembly innovations drive more performance using highly dense interconnects. Assembly residues may increase the risk of premature failure or improper functionality. The challenge for OEMs is to quantify safe residue levels and gain insight into how residues impact long term reliability and functionality of hardware. To compound this problem,the question of “how clean is clean enough” is more challenging as conductors and circuit traces are increasingly narrower. Highly dense bottom termination components decrease conductor pitch,spacing and standoff heights. The problem is that current spacing trends can yield spacing between printed circuit traces as small as 2 mils. As electrical fields rise,contamination at these narrower traces becomes more problematic due to voltage swings,high frequencies,leakage currents,and high impedance. The objective of this research is to advance the understanding of chemical and electrical effects on reliability of high dense interconnects Phase 1 of the research focused on designing a new test vehicle to measure electrical responses to high voltage,rate of current change and frequency. Phase 2 studied the effects of high voltage effects on leakage currents in the presence of flux residue and environmental conditions under bottom termination components. Phase 3 will study the effects of frequency on leakage currents in the presence of flux residue and environmental conditions under bottom termination components.