There are many ways of specifying units for many different measurements,and over the years they have developed a life of
their own. For example,length was once measured with glorious imprecision. In 100AD King Edgar of Saxony defined the
yard as the distance from the tip of the his nose to the end of his outstretched thumb. Useful measure that. Can you imagine
asking the King to “Come over here,I want to make sure this length of timber is one yard”? Or how about a “perch”?
Originally defined as “the total length of the left feet of the first sixteen men to leave church on Sunday morning”. Very
useful – Not! Then we have the roofing industry giving us copper thicknesses in ounces per square foot. How useful is that?
These days we are doing much better. Apart from some obscure methods of measuring various parameters,we find the most
universal systems are based on the pound,the inch and the second (“English” system) and the meter,gram and second,
known universally as the metric system and more specifically as the SI system for Systeme International d'Unites,
originally the system developed in France and adopted by Europe. Notice that time units are the same in both – a sign that
convergence is possible.

One of the most enabling product industries in the world today is Computer Automated Design (CAD). Can you imagine how
far technology would have progressed if not for the automation of computer design? CAD has had a major impact on
technologies available today,yet users of CAD toolsets take for granted the advancements that have been made throughout
the years.
This presentation,instead of focusing on CAD’s past,will take a look at the strength and weaknesses of today’s CAD
toolsets. We’ll take a look at where current development is taking these toolsets and we’ll even take a look into my crystal
ball to see how the future demand for electronic products will shape the toolsets of tomorrow (given that they still will have
to keep up with time-to-market,correct-by-design and all the other industry demands).

Microvias are the fastest growing new technology for printed circuits. This talk will highlight the procedures,standards and
conditions that designers needs to consider to introduce microvias to their printed circuit board designs. The basis for these
procedures is the IPC-2226,IPC-4104 and IPC-6016 HDI standards. The talk will cover: Microvia Platform Types and Examples,
General Requirements,Material Considerations,Mechanical/Physical properties,features sizes and constructions,Electrical
Properties and Thermal Management.

This paper presents a functional signature analysis method for the end-of-life management of products,particularly for
electrical-electronics and electromechanical applications.
Due to the fast (r)evolution of electronics and,related,software new functionality becomes available in at an increasingly fast
rate. This means that,quite often,products are economically outdated before the technical end-of-life of a product is reached.
This is a far from optimal situation; often good working products are discarded because they are economically outdated with
all negative side-effects not only in financial terms but also with respect to terms of ecology. In this respect the ability to
analyze and predict the (remaining) technical life of a product would enable manufacturers either to re-use good subassemblies
in the manufacturing process of new products or to design products with such design margins that economical
and technical lifetime match. This requires models with the ability to predict function performance degradation over life.
Therefore,this project aims at defining methods (and related tools) to extract the mentioned indicators by analyzing the
function performance over life and to have a single measure of the reliability performance to identify source of failure and
performance deterioration by signals available for external measurement.
The signature analysis method uses a complete new approach,which differs significantly from methods used in preventive
maintenance,designing for reliability,or on-line monitoring of quality characteristics in production processes. This paper
presents the signature analysis method. The protocol for carrying out the signature analysis is discussed and the application
of functional signature analysis for end-of-life management is reviewed.

This paper describes the life-cycle impact assessment methodology developed by the University of Tennessee to calculate
the impacts resulting from the use of lead and lead-free solders during the manufacture and assembly of electronics. Formulas
for calculating individual impact categories are presented and briefly discussed. Actual impact scores resulting from the application
of this methodology within the LCA research being conducted as part of the Lead Free Solder Partnership are currently
being reviewed and will be presented in detail in a future publication.

At times,the electronics industry changes faster than the testing and regulatory groups serving the industry. In this case,the
electronics supply chain thoroughly evaluated the new printed circuit board (PCB) surface finish Immersion Silver. The
silver finish was subjected to comprehensive testing and received product specifications throughout all industry sectors
between 1995-2003. Specifications within Underwriters Laboratories (UL),however,were not current with the industry
testing. UL maintained concerns over the use of silver metal in electronic packages,and implemented special testing for PCB
devices using silver in their construction if the device was intended to operate at higher voltage/energy levels. UL’s concern
with the use of silver revolved around historical accounts of dendrite formation,a type of defect caused by electrochemical
migration. The UL restriction began to hinder widespread use of immersion silver by OEM’s who had conducted extensive
reliability studies. Upon review,it was determined that the UL electrochemical migration test method needed to be updated to
reflect changes in PCB technology. Further investigation proved that all surface finishes could fail the UL test method,even
if there was no evidence of dendrite formation.
A group of companies from the electronics supply chain formed a Task Group to work with UL in updating their
specifications. Later,this group became the IPC 3-11g Metal Finishes Data Acquisition Group. This article describes the
testing,demonstrations,revisions,and ongoing work of IPC 3-11g in coordination with Underwriters Laboratories. More
specifically,this article will present data from a team project to identify the important parameters affecting electrochemical
migration from the viewpoint of UL.

To meet the emerging requirement of eliminating lead from electronics,the printed wiring board (PWB) industry is migrating
from hot-air-leveled SnPb solder to alternative final finishes. A thin layer (2-3 microinches) of silver coating on copper has
proven to be solderable for up to one year,and to withstand the higher temperature excursions encountered when using lead–
free solders. A new improved process capable of a wide range of thickness is needed to meet current and future applications
beyond solderability,such as pressfit and long term contact resistance. There is a perception that silver thickness alone
determines application success. This paper describes a new immersion silver process and the resulting coating properties in
tarnish resistance,solderability,surface insulation resistance and electromigration resistance.

The influence of co-deposited Phosphorous (P) (from low to high P) within an electroless Nickel layer,regarding the
reliability of the solder joint integrity was investigated. The solder joint evaluation was carried,using solder mask defined
BGAs as test vehicle and using the ball shear technique to establish the level of any “Brittle Fracture”.
The type and structure of the IMC created before and after thermal cycling was examined against the co-deposited P (from
low to high P) within an electroless Nickel layer to determine if this has any influence on solder joint integrity.
Due to the nature of the electroless plating process,a high P-ENIG coating has a P content in the plated electroless Nickel
layer of about 9.5 to 13 wt.%. This high P content leads to an amorphous structure,with no grain boundaries,which therefore
influences the formation of the IMC between Nickel and solder. The high P content of the bulk electroless Nickel layer seems
to control the diffusion rate of the Nickel into the solder,resulting into a dense and uniform IMC formation.
This paper describes the influence of co-deposited P (from low to high P) within an electroless Nickel layer,regarding
“Brittle Fracture” and the reliability of the solder joint integrity,using solder mask defined BGAs as test vehicle.
The variation of the co-deposited P content did alter the characteristics of the ENIG surface,which impacts the yield at the
assembler. It turns out that a high P content in the bulk Nickel layer increases the reliability of the solder joint.

With the electronics industry rapidly moving to lead-free soldering and requirements for long term reliability of the assembly
becoming more critical,fabricators and OEM’s must determine the most cost effective and reliable means of achieving bare
board solderability and component attachment. OSP’s have long provided a reliable and inexpensive means of satisfying
these requirements. However,greater solderability requirements,(measured as joint strength,paste spreadability and hole fill),
and higher temperatures of lead-free soldering,have greatly diminished the use of conventional (standard substituted
benzimidazole based) OSP’s. However,with the development of third and fourth generation organic solderability
preservatives based on a novel aryl-phenyl imidazole compound,OSP has regained its leadership role as a final finish,
particularly in Asia and Europe. In addition,the technology shift to bare copper PWB’s with selectively plated gold features
is requiring OSP’s that do not tarnish or deposit on the gold. This paper will explore the development and implementation of
the next generation OSP for lead-free soldering. The OSP performance will be compared to other surface finishes (ENIG,
ImTin,Immersion Silver,conventional OSP) in terms of solder paste spreadability,solder hole fill and solder joint strength.
Reliability studies will be performed with both standard lead based solders and lead-free solders and include solderability
performance with multiple reflows and artificial aging conditions.

An Electroless Nickel and Immersion Gold (ENIG) plating process with a middle phosphorous content nickel layer is
currently a mainstream final finishing application for mobile phone Printed Wiring Boards (PWB). As a trend according to
the worldwide market growth of mobile phones,the demand for higher resistance characteristics in corrosive environments
for ENIG finished boards has increased. Although various methods have been introduced as an evaluation method for higher
corrosion resistance,sulfurous acid gas (SO2 gas) testing is a recent area of industry focus. However,because of the
significant corrosive characteristic of SO2 gas,the conventional ENIG layer cannot tolerate this testing method,and thus has
become an area of major concern. As a result,a high phosphorous nickel ENIG plating process,which inhibits higher
resistance in a corrosive environment compared to a middle phosphorous process,is being adopted as a final finishing
method. However,several other factors of the total plating process that may influence corrosion resistance have not been
verified or fully investigated. Therefore,in this study we introduce ENIG plating layer characteristics required for higher
resistance in corrosive environments by investigating corrosion conditions of ENIG layers caused by SO2 gas testing,and
furthermore conduct observations on factors that influence these ENIG characteristics.