Reliability Performance of Very Thin Printed Circuit Boards with regard to Different any-Layer Manufacturing Technologies
The next generation of smart phones will demand very thin multi-layer boards to reduce the product thickness again. This paper shows three different manufacturing approaches,which can be used for very thin any-layer build-ups. The
technological approaches are compared on reliability level – the any-layer copper filled micro-via technology which is to be
considered as state of the art technology for high end phones and the ALIVH-C/G technology that is well established in Japan. A test vehicle design featuring test coupons for comprehensive reliability test series has been defined as target application for investigation. The applied test vehicle build-ups comprise an 8 layers build-up with total board thickness below 500 µm. The first test vehicle is based on an any-layer HDI build-up including copper filled stacked micro via
structures,the second test vehicle features an 1+6+1 ALIVH-C build-up comprising an outer HDI prepreg layer while the
third test vehicle is built in ALIVH-G technology featuring a full ALIVH build-up.
The influence of the applied manufacturing technology on the reliability performance of thin PCBs is evaluated based on these three test vehicle build-ups. To cover the behavior during SMD component assembly the produced samples are subjected to reflow sensitivity testing applying a lead free reflow profile with a peak temperature of +260ºC. Failure occurrence and the observed failure modes are
evaluated and compared. In parallel a temperature cycling test is conducted on the test vehicles in a temperature range between -40 ºC and +125 ºC in order to evaluate the thermo mechanical reliability of the test vehicles with regard to the manufacturing technology. In order to characterize the reliability aspects influenced by electrochemical migration phenomenon the different samples are subjected to a HAST test at +130 ºC with 85 % humidity level. The results obtained from reliability testing are summarized and compared within this paper. The identified relations between manufacturing technology and the reliability performance of the test vehicles are shown; strengths as well as weaknesses of the applied any-layer technologies are identified and summarized.