RoHS legislated restrictions on the materials used in electronics manufacture have imparted significant challenges on the electronics industry since their introduction in 2006. The greatest impacts have been felt by the mandated elimination of lead from electronic solder followed by the demand for the elimination of haloids from flame retardants used in traditional PCB laminates. In the years which have followed the electronics industry has been beset with a host of new challenges in its effort to comply. Failure mechanisms,both new and old,have surfaced which demand solution and the industry suppliers and manufacturing technologists have worked diligently to remedy those vexing faults through the development of a wide range of new materials and equipment for both board manufacture and assembly,along with modifications to the processes used in the manufacture and assembly of printed circuit boards.
Most of the problems which have confronted the electronics manufacturing industry have related to the solder assembly process. Lead-free solders were advertised early on as a drop-in replacement for traditional tin lead solders however field experience proved is not to be the case. The tin rich alloys along with the higher temperatures which were required for assembly cause the industry to scramble for solutions to such problems as champagne voids,poorer wetting,brittle solder joints,copper dissolution,tin whiskers,head in pillow,greater vulnerability to damage caused by explosive outgassing of absorb moisture in packages among others including cleaning of baked on fluxes following the high temperature assembly process. Lead-free solder also had spillover effects on the PCB laminate material itself as manufacturers experienced delamination and degradation of the resins used in circuit construction. One more recently encountered problem is a phenomenon referred to as pad cratering wherein resin beneath the copper land to which a component is attached is actually torn loose from the surrounding resin breaking through the copper and causing an open.
In this environment,an alternative approach to manufacturing electronic assemblies has been conceived and is presently being developed. The new method in simplest form is one which eschews the use of solder and is predicated on the use of aluminum substrates which house fully tested and burned in components to create what can be best described as a component board wherein the terminations of the components are proximately planar with the surface of the aluminum. In subsequent processing the aluminum component board is first coated with an insulating material and then circuits which interconnect the components are applied using buildup technologies. An example of a test vehicle is shown in Figure 1.

The functional reliability of electronic circuits determines the overall reliability of the product in which the final products are used. Market forces including more functionality in smaller components,no-clean lead-free solder technologies,competitive forces and automated assembly create process challenges. Cleanliness under the bottom terminations must be maintained in harsh environments. Residues under components can attract moisture and lead to leakage currents and the potential for electrochemical migration.
Removing flux residues from under bottom terminations is extremely challenging. As components decrease in size,the Z-axis gap height also reduces. When the Z-axis gap is less than 3 mils (75um),the capillary and wetting action of flux during reflow underfills the bottom termination component with flux residue. To clean,the cleaning fluid and mechanical action must reach,wet and dissolve the soil in order to create a flow channel. Once a flow channel is created,the soils under the terminations are effectively cleaned.
The purpose of this research study is to evaluate innovative spray and soak methods for removing low residue flux residues and thoroughly rinsing under Bottom Termination and Leadless Components. Targeted spray nozzles deliver the cleaning agent to the soil. Following this interaction with an agitated soak allows the flux residues to dissolve. Targeted spray nozzles rapidly move the dissolved residues and fully clean residues under terminations. This designed experiment will study process parameters in order to draw inferences from the data findings.

Historically,the determination of the concentration of cleaning agent in high precision electronic cleaning baths has depended on any one of several possible measurable parameters. Refractive Index (RI) is by far the most common. RI methods are excellent tools for use in simple systems where a single solute dominates the signal. In these situations,it is possible to characterize and calibrate how that solute affects the signal. However,the introduction of flux residues during the wash bath lifetime complicates the bath chemistry/physics to such an extent that RI signals no longer provide the same insight.
The introduction of flux residue has an enormous influence on the Refractive Index. Alternative means of measuring cleaning agent are necessary if cleaning agent concentration is to be known throughout the life of the bath. With a means to accurately measure bath cleaning agent,closed loop automated process control on the cleaning bath is possible; automating this labor intensive step in the production of electronic boards. We have found that acoustic measurements of cleaning bath solution are relatively independent of pH,conductivity,and dissolved solids in some of the most flux loaded baths. Utilizing acoustic sensing technology,field data was gathered from two beta site locations assessing the accuracy of the technology in fresh as well as contaminated wash baths.

On January 1,2015,nine months from APEX 2014,the production and use restrictions on HCFC-225 will be in effect throughout the United States. This phase out is encompassing in scope. This phase out will have significant technical,performance,and economic implications for the electronics industry. The regulatory situation remains fluid. A number of alternative solvents have been or are in the process of being developed. We discuss the options for assemblers and component manufacturers.

In the past 20 yrs the solvent industry has gone through a great deal of change. In the early 1990s,CFC-113 and 1,1,1-trichloroethane were the workhorses of the industry. The Montreal Protocol to phase-out substances that deplete the Earth’s protective Ozone Layer was implemented in the mid 1990s to reduce chemicals with ozone depletion potential. After phase-out of the CFC solvents,the solvent industry fragmented to a variety of cleaning solutions. The electronics industry was a large user of CFC solvents and many of these applications changed to aqueous based cleaners. Some of the industries moved to chlorinated and brominated solvents such as trichloroethylene and n-propyl bromide. Other industries changed to no-clean fluxes. But those alternatives are now facing various problems: e.g. aqueous based cleaners use a lot of energy,require long drying times,use equipment that requires frequent maintenance,and require a large footprint; no-clean fluxes leave flux residues; and trichloroethylene and n-propyl bromide have toxicity issues. In response to these serious issues newer solvents and blends are being introduced in the marketplace.
In this pursuit the company developed a new low global warming potential fluorinated solvent for precision cleaning. This solvent has a mosaic of properties that make it a good solution in the solvent domain. It is non-flammable,has low toxicity,environmentally friendly,low surface tension,rapid drying,excellent solvency and a number of other favorable properties. In this paper we will review the properties and performance of the new solvent.

Examination of historical data for a defunct electronics manufacturing plant in Ontario,Canada has allowed the
determination of the potential global warming contribution by the plant for the years 1971 to 1995,inclusive. The
biggest contributors were determined to be consumed electrical power produced by burning fossil fuels,natural gas
usage,employee travel to and from work and discharge of gaseous chlorofluorocarbons (CFCs),while they were
being used. The latter dwarfed all other contributors.

Solder beading and tombstoning are observed increasingly with chip components as their size decreases. This is
even more crucial in today’s packaging,due to the high ratio of passive components in comparison to active
components. The increasing number of passive components affects the Defects Per Million Opportunities (DPMO),
which inturn affects the overall yield of the assembly line. Hence,it is vital to understand the various causes within
the assembly process,which influence the occurrence of these defects. This paper will discuss the results of a
process characterization study to understand the effects of solder paste,stencil thickness,board support,reflow
profile and the component size on the formation of solder beads and tombstones. A Resolution-V DOE analysis was
performed to determine the effect of these factors on the defect occurrence. The response variable for the study was
% defects,the ratio of number of defect occurrences to the total number of available defect opportunities.

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A new non-halogen flame retardant has been developed and is useful for a variety of high performance applications. This
non-reactive phosphorus-based material satisfies fire safety needs for a broad range of resins including epoxy,polyolefin,and
polyamide. The combination of excellent flame retardant efficiency,high thermal stability and exceptional electrical
properties is unique to this organophosphorus flame retardant and makes it a breakthrough technology for high speed,high
frequency use in fast growing wireless and wired infrastructures. Resin performance data,including formulations with
synergists,are presented in this paper.

Multi-layer organic laminates which make up over 90% of the present types of interconnecting substrates in today’s electronics can develop a loss of insulation resistance between two biased conductors due to a failure mechanism known as conductive filament formation. The probability of CFF is a function of temperature,moisture content,the voltage bias,manufacturing quality and processes,materials and other environmental conditions and physical factors. Filament formation typically appears to arise in two steps: a degradation of the resin/glass fiber bond followed by an electrochemical reaction. Bond degradation provides a path along which electro-deposition may occur due to electrochemical reaction. The path may result from poor glass treatment,from the hydrolysis of the silane glass finish and from mechanical stresses. Microscopic examinations of failure sites have shown that conductive filaments can be formed along de-bonded or delaminated fiber glass/epoxy resin interfaces,due to breaking of the silane bonds. The bi-functional silane molecules act as a link between the glass fiber and resin by forming a chemical bond with the glass surface through a siloxane bridge,whereas its organo-functional group bonds to the polymeric resin. The organosilane bonds are known to chemically degrade by hydrolysis. This paper will characterize the degradation of the interfacial bonds between the glass fibers and organic resin. Analytical technical techniques such as Nano-indentation are used to characterize the quality of the interface and follow the change in this interface as a function of absorbed moisture into the PCB.