High Temperature Thermal Cycling Reliability Testing of a High Reliability Lead-free Solder Alloy
In recent years there has been an increased demand for electronic products with high reliability solder alloys having improved performance in thermal cycle resistance for harsh working environments. Traditional thermal cycling tests have used 40°C to +125°C for automotive type applications. There has been an increased focus on increasing temperature cycling test range to a higher temperature to account for increased product temperatures in the field. The work discusses thermal cycling results from -40°C to +150°C for soldered QFN/BTC and chip components with lead-free Sn3.5Ag0.5Bi6In0.8Cu (SABIX) and Sn3Ag0.5Cu solder alloys and ageing results at 150°C.
Reliability tests were undertaken by Thermal Cycling (-40°C to +150°C, 3,000 cycles) and Shear Strength testing with analysis of the amount of solder joint micro-cracking during thermal cycling. Thermal ageing tests were also undertaken at 150°C for 32 days (768 hours) for soldered chip components with Shear Strength testing during the thermal ageing tests and microstructural analysis. Cross-sectional and EBSD (Electron Back Scattered Diffraction) analysis were also undertaken on as-received (Time zero) and thermally cycled soldered chip component boards.
Tests done with the no-clean lead-free high reliability alloy (Sn3.5Ag0.8Cu0.5Bi6In (SABIX)) paste included Printability, Viscosity, Wetting and Void Occurrence after reflow for Power Transistor/BTC, BGA and chip components and Electrical ECM reliability. The results of the work are reported.
Keywords: Thermal cycling, high reliability alloy, ageing, shear testing, cross-sectioning, lead-free