End-of-Life Management of Electronics Products Through Functional Signature Analysis
This paper presents a functional signature analysis method for the end-of-life management of products,particularly for
electrical-electronics and electromechanical applications.
Due to the fast
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Event
IPC APEX EXPO 2004
Introduction to Microvia Design
Microvias are the fastest growing new technology for printed circuits. This talk will highlight the procedures,standards and
conditions that designers needs to consider to introduce microvias t
.. read more
Event
IPC APEX EXPO 2004
CAD Toolsets: Today,Tomorrow and Over the Horizon
One of the most enabling product industries in the world today is Computer Automated Design (CAD). Can you imagine how
far technology would have progressed if not for the automation of computer
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Event
IPC APEX EXPO 2004
PCB Design Using the Metric System
There are many ways of specifying units for many different measurements,and over the years they have developed a life of
their own. For example,length was once measured with glorious imprecisio
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Event
IPC APEX EXPO 2004
The CAD Library of the Future
The electronics industry is constantly growing and introducing new technology sometimes faster than we can keep up with. This
paper reviews one of the single most important,but sometimes overlo
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Event
IPC APEX EXPO 2004
VIGOR European Project New Industrial Applications in 3-D Interconnection
The 3-D interconnection and packaging emerged from the last decade. Today,the 3-D interconnection technologies are
becoming mature and their reliability assessed. 3-D technology constitutes the
.. read more
Event
IPC APEX EXPO 2004
Liquid Solders for High Temperature Solder Joints
This paper presents a new joining technology for high-temperature application of solder joints,based on the results of the
joint research project "TLSD". By the use of temporary liquid solder j
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Event
IPC APEX EXPO 2004
Using High Volume Electronics Manufacturing Technology to Develop a High Volume Fuel Cell Manufacturing Process
During the last several years there has been and continues to be an enormous investment by both governments and industry in
the development and manufacture of fuel cells. The United States,Japa
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Event
IPC APEX EXPO 2004
Jetting of Underfill and Encapsulants for High-Speed Dispensing in Tight Spaces
The underfill process has become common practice in the assembly of flip chip and CSP devices and the practice of area
array assembly has been adopted by many board designers and component asse
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Event
IPC APEX EXPO 2004
Wafer Applied Underfill: Flip Chip Assembly and Reliability
Manufacturers of consumer electronic products are continuously striving to confer greater functionality to smaller,lighter,
and less expensive packages,and flip chip is an important enabling te
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Event
IPC APEX EXPO 2004
Influence of Flux and Powder Morphology on Void Formation in Silicon Wafer Bumping
Use of solder paste as a material to bump silicon wafers for interconnection to other level of package interconnection is a
simple and cost effective process. However,the material properties of
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Event
IPC APEX EXPO 2004
Flip Chip Connections Using Bumps,Wells,and Imprinting
A conceptual framework for a new type of flip chip attachment is proposed. Gold stud bumps are provided on the chips,and
wells filled with solder paste are provided on a flexible substrate serv
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Event
IPC APEX EXPO 2004
Stencil Design and Performance for Flip Chip/Wafer Bumping
There has been much recent interest in printing solder paste onto UBM pads of a wafer. Usually the wafer pad is overprinted
using a stencil aperture that is larger than the wafer pad. This perm
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Event
IPC APEX EXPO 2004
Lead-Free Solder Bumping Technologies
Electroplated pure tin and tin alloys such as Sn99.3Cu0.7%,Sn98%Bi2% and Sn96.5%Ag3.5% have been identified as
viable drop-in replacements to tin-lead solder. High melting point tin alloys such
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Event
IPC APEX EXPO 2004
Enhanced Eutectic Solder Bump for Increased Flip Chip Reliability
Applications using flip chips in high temperature and high current designs have increased in recent years,and this trend is
expected to continue. Markets utilizing these designs include high pe
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Event
IPC APEX EXPO 2004
Creep of Sn-(3.5-3.9)wt%Ag-(0.5-0.8)wt%Cu Lead-Free Solder Alloys and Their Solder Joint Reliability
A new set of constitutive equations for a class of lead-free solder alloys,Sn(3.5-3.9)wt%Ag(0.5-0.8)wt%Cu is proposed in
this investigation. These equations are applied to a 256PBGA (plastic ba
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Event
IPC APEX EXPO 2004
An Assessment of the Impact of Lead-Free Assembly Processes on Base Material and PCB Reliability
Environmental regulations are forcing the elimination of lead (Pb) from electronic equipment. Solders containing lead have
been the standard in printed circuit assembly processes. Lead-free sol
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Event
IPC APEX EXPO 2004
Solder Preforms: Increasing Automated Placement Efficiency
Solder preforms are precise shapes of metal,produced by the high-speed stamping or forming of solder wire or ribbon.
Preforms provide a highly repeatable volume of solder,with 100% metal conten
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Event
IPC APEX EXPO 2004
Through-Hole Assembly Options for Mixed Technology Boards
Surface mount assembly has dominated its through-hole predecessor since the early 1990s. The higher density and lower
ultimate cost of SMT makes it a preferred assembly technology. However,the
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Event
IPC APEX EXPO 2004
Wave Solder Process Optimization for Complex Electronic Assemblies: A Design of Experiments Approach
Numerous technical articles have dealt with machine parameters,and their effect on wave soldering of Printed Circuit Boards
in the range of 40-93 mils and the typical 6 to 8 layers. This resear
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Event
IPC APEX EXPO 2004
R/flex® 3000 Advanced Circuit Materials = LCP Stability & Performance from 1GHz to 110 GHz
This paper will discuss how R/flex® 3000 LCP materials from Rogers Corporation are "pushing the envelope" for high -
frequency & flex designs by examining:
1. How the material set has now been
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Event
IPC APEX EXPO 2004
Optimal PCB Test Trace Design for Improved Quality Control
A common industry practice is to confirm the characteristic impedance of critical PCB traces meet specified performance
tolerances before any components are attached. A popular technique is to
.. read more
Event
IPC APEX EXPO 2004
Effects of Conductor Surface Condition on High Frequency Loss
Efforts to reduce high frequency signal losses associated with dielectric materials have driven development and
commercialization of more cost effective low loss laminate materials. These devel
.. read more
Event
IPC APEX EXPO 2004
Electrical Characteristics of High Speed Materials
This paper will discuss the two primary transmission components that concern designers today. These components affect the
signal integrity of all high-speed transmissions in printed circuit boa
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Event
IPC APEX EXPO 2004
High Speed Interconnects: The Impact of Spatial Electrical Properties of PCB due to Woven Glass Reinforcement Patterns
The impedance and electrical property variation resulting from spatial patterns in woven glass reinforced laminate materials
are greatly impacting high speed interconnect designs. As the transf
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Event
IPC APEX EXPO 2004
Power Consumption and Closed-loop Nitrogen Control Considerations in Lead-free Reflow
When transitioning to lead-free reflow,consideration should be given to the additional costs of operation,above and beyond
material costs.1 Impacts to the overall reflow process should be caref
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Event
IPC APEX EXPO 2004
Optimizing Your Reflow Profile for Maximum Productivity and Profitability
Successful reflow soldering is a key to productivity and profitability,yet many assemblers may be using a nonoptimized
reflow profile.
Years ago,when IR ovens were the norm and solder pastes we
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Event
IPC APEX EXPO 2004
Moisture and Reflow Sensitivity Evaluations of SMT Packages as a Function of Reflow Profile at Eutectic and Lead Free Temperatures
Epoxy molding compounds are used extensively in the electronics industry to encapsulate surface mount Integrated Circuits
(ICs). The primary purpose of encapsulating the SMT package using these
.. read more
Event
IPC APEX EXPO 2004
Transitioning from a Reactive to a Proactive Manufacturing Culture
We often hear or use the terms “World Class Manufacturing” or “Best in Class Manufacturing” in reference to our
manufacturing operation or perhaps a competitor’s or supplier’s manufacturing ope
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Event
IPC APEX EXPO 2004
Process Capability Studies – The Better Way
To estimate the ability of a process to perform according to the product’s design (i.e.,specification),process capability
indices (Cp,Cpk,etc.) are used. What most people fail to realize,howeve
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Event
IPC APEX EXPO 2004
The “Only Other” Sure Thing in Life
Today,there are only three certainties in a circuit board market that for the last three years has proven anything but certain:
death,taxes,and military business. As the overall North American
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Event
IPC APEX EXPO 2004
Continuous Improvement: Know Thy Customer: Customer Relationship Management Pays
The overall mission and foundation of business today,as it was yesterday and undoubtedly will be tomorrow,is to maximize
customer service. Customer Relationship Management (CRM),although a rela
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Event
IPC APEX EXPO 2004
How to Take Care of Loyal Customers
Loyal customers are customers who will pay premium price for exceptional products and services,refer other customers to
buy products and services,buy a whole range of products and services from
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Event
IPC APEX EXPO 2004
Lean and Continuous Improvement
Lean and Continuous Improvement are distinct performance improvement strategies. Each has its own objective and
methodology and is highly inter-woven. Lean Manufacturing uses the strategy of Ka
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Event
IPC APEX EXPO 2004
Three-dimensional Simulations of Current Density Distributions for Patterned Wafers and PCB's
Mass transfer effects and reactor design play an important role in the plating process of electronic interconnects. To improve
the behaviour and performance of the plating reactors used for ele
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Event
IPC APEX EXPO 2004
Enhancing the Performance of a Graphite Direct Metalization Process
Colloidal graphite direct metalization processes have proven their usefulness as a replacement for electroless copper. This is
especially the case in high technology and quick turn applications
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Event
IPC APEX EXPO 2004
Using Periodic Pulse Reverse (PPR) for Plating Thick Panel Applications
There is increased interest in the printed wiring board (PWB) industry with regards to the use of periodic pulse reverse (PPR)
plating to electroplate printed circuit boards. PPR plating offers
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Event
IPC APEX EXPO 2004
Process for Plugging Low to High Aspect Ratio Through-Holes with Polymer Thick Film Conductive Ink in Production Volumes
With an increasing number of designers specifying conductive material for plugging through-holes,a more robust process to
produce 100% fill is needed for the whole range of aspect ratios. With
.. read more
Event
IPC APEX EXPO 2004
Copper Electroplating Technology for Microvia Filling
This paper describes a copper electroplating enabling technology for filling microvias.
Driven by the need for faster,smaller and higher performance communication and electronic devices,build-u
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Event
IPC APEX EXPO 2004
Enhancing Interlaminar Bond Strength for High Performance Resin Systems and Liquid Photoimageable Soldermasks with an Organo-metallic Copper Surface Treatment Process
The technology shift toward higher performance (low Dk,low Df,faster signal speeds) resin materials for high reliability
high layer count multlayer interconnect devices is moving rapidly. PWB f
.. read more
Event
IPC APEX EXPO 2004
PTFE Wettability for Electroless Copper and Direct Metallization
PTFE material is very hydrophobic and among the most difficult to deposit electroless copper or direct metallization. These
materials have very low friction,which makes a surface non-wettable.
.. read more
Event
IPC APEX EXPO 2004
Peroxy-Sulfuric Oxide Replacements – A Pathway to Improved Technology for Fine Line Processes
Traditional reduced black oxide processes for inner layer bonding have been superseded by a newer generation of peroxidesulfuric
texturing processes. These lower cost processes,based on an orga
.. read more
Event
IPC APEX EXPO 2004
High Frequency Conductor Loss Impact of Oxide and Oxide Alternative Processes
In most of today's high speed digital interconnects,the signal loss associated with the printed circuit board (PCB) is the
dominate factor. Material selection,trace geometry,and choice of coppe
.. read more
Event
IPC APEX EXPO 2004
Advanced Microvia Design
Microvias are the fastest growing new technology for printed circuits. Once you understand the basics,the advanced topics
bring the real advantage to light. This talk will highlight the procedu
.. read more
Event
IPC APEX EXPO 2004
Automatic Generation of RC Network Models for a BGA Package
The need for dynamic compact models for Integrated Circuits (ICs) is a well-recognized problem in electronics cooling
simulations of electronic systems. Simplified thermal models have been repo
.. read more
Event
IPC APEX EXPO 2004
Signal Integrity Analysis Techniques used to Characterize PCB Substrates
The electrical properties of PCB substrates are one of the primary factors used in designing high-frequency printed circuit
boards. The loss tangent is the electrical property used by material
.. read more
Event
IPC APEX EXPO 2004
Insertion Loss,Eye Pattern and Crosstalk Analysis of Mixed Dielectric Striplines (Simulation and Measurement)
As digital data rates reach 5Gb/s,10Gb/s and beyond,digital designers are finding it increasingly difficult to meet their
design constraints using FR4. While there are a host of alternative mat
.. read more
Event
IPC APEX EXPO 2004
FPGA on Board
Whilst the number of new ASIC designs has decreased over the last couple of years,there has been a dramatic increase in the
number of FPGA designs implemented. Not only have the number of desig
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Event
IPC APEX EXPO 2004
Conquer Tombstoning in Lead-Free Soldering
Tombstoning of SnAgCu is affected by the solder composition. At vapor phase soldering,both wetting force and wetting
time at a temperature well above the melting point have no correlation with
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Event
IPC APEX EXPO 2004
Tin Whisker Growth - Substrate Effect Understanding CTE Mismatch and IMC Formation
The hypothesis that the “whisker growth phenomenon” in electrodeposited tin is a re-crystallization process driven by stress
has gained popularity among leading research institutes and industri
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Event
IPC APEX EXPO 2004