Welcome to IPC's collection of technical papers presented at conferences since 2002. You can search by author, title and keyword. You can also search for keywords and topics in the Tag field. Access to the papers is reserved for IPC members.

Conformal Coating over No Clean Flux

As the proliferation of modern day electronics continues to drive miniaturization and functionality,electronic designers/assemblers face the issue of environmental exposure and uncommon applica .. read more
Author(s)
Karl Seelig,Timothy O'Neill
Event
IPC APEX EXPO 2013

Reliability Assessment of No-clean and Water-soluble Solder Pastes Part I

Looking back twenty-five years ago,the solder pastes residues had to be cleaned after reflow due to their corrosive nature: two ways of cleaning were possible,either with solvent or by using wa .. read more
Author(s)
Emmanuelle Guéné,Steven Teh
Event
IPC APEX EXPO 2013

Liquid Flux Selection and Process Optimization for Selective Soldering Applications

There has been a rapid increase in the use of selective soldering equipment for PCB assembly –Lower equipment costs –Smaller equipment footprint –Lower solder “inventory” cost (smaller pots) –D .. read more
Author(s)
Mike Murphy,Russel Maynard,Laxminarayana Pai,Corné Hoppenbrouwers,Ansuman Das,Anubhav Rustogi
Event
IPC APEX EXPO 2013

Halogen Free Solder Paste

•What is a halogen? •Impact on the environment •Halides and halogens •Halides in electronics •Halogens in electronics •Definition of halogen free •Technical challenges to remove halogen •Curren .. read more
Author(s)
Gavin J. Jackson,Ian J. Wilding,Mark Currie
Event
IPC APEX EXPO 2013

Lead-free Nanosolders and Nanowire Joining for Microelectronics/Nanoelectronics Assembly and Packaging

- Nanosolder on multi-segment nanowires have been successfully fabricated by electrodeposition method; - Flux assisted environment enhanced reflow result and micron scale solder spheroids forme .. read more
Author(s)
Fan Gao,Zhiyong Gu,Sammy Shina
Event
IPC APEX EXPO 2013

Voiding: Contrary Effects of Voiding

#NAME? .. read more
Author(s)
Hans Bell,Helmut Öttl,Heinz Wohlrabe
Event
IPC APEX EXPO 2013

The Last Will and Testaments of Tin/Lead and Lead-free BGA Voids

Conclusions: •Tin/Lead BGAs: The location of the void within the solder joint was the primary root cause for the loss of solder joint integrity. •Lead-free BGAs: The statistical analysis and th .. read more
Author(s)
Dave Hillman,Dave Adams,Tim Pearson,Ross Wilcoxon,John Travis,David Bernard,Evstatin Krastev,Vineeth Bastin,Mario Scalzo,Bev Christian,Brandon Smith
Event
IPC APEX EXPO 2013

Voiding Mechanism and Control in Mixed Solder Alloy System

•Transition to Pb-free soldering is incomplete for high reliability or high temperature applications •For those not fully converted into Pb-free,mixed system is common due to lack of some Pb-co .. read more
Author(s)
Yan Liu,Derrick Herron,Joanna Keck,Ning-Cheng Lee
Event
IPC APEX EXPO 2013

Method to Measure Intermetallic Layer Thickness and Its Application to Develop a New Equation to Predict Its Growth

Lead Free Technology has brought new materials and different quality concerns to the Electronics Industry. For that,the creation of new methods to determine the quality of materials is needed a .. read more
Author(s)
Jose Servin
Event
IPC APEX EXPO 2013

Assembly Materials for High Temperature Application

Based on the trend for new technology in the automotive market including high power modules for e-mobility,and a combination of logic and power which will be developed for the future market wit .. read more
Author(s)
Jörg Trodler
Event
IPC APEX EXPO 2013

Reliability of Lead-Free LGAs and BGAs: Effects of Solder Joint Size,Cyclic Strain and Microstructure

An accelerated thermal cycle experiment comparing similarly constructed area array devices representing Land Grid Array (LGA) and Ball Grid Array (BGA) technology with 0.254,0.30,and 0.40mm dia .. read more
Author(s)
Denis Barbini,Michael Meilunas
Event
IPC APEX EXPO 2013

Quantitative Analysis of Corrosion Resistance for Electroless Ni-P Plating

An electroless nickel (EN) layer is frequently used in various industrial applications. Commonly it is used as the barrier layer in electroless nickel/immersion gold (ENIG) as a solderability p .. read more
Author(s)
Lei Jin,Jun Nable,Kesheng Feng,Lenora Toscano,Ernie Long
Event
IPC APEX EXPO 2013

Simulation of Embedded Components in PCB Environment and Verification of Board Reliability

Embedded components technology has launched its implementation in volume products demanding for highest miniaturization level. Small modules with embedded dies and passive components on the top .. read more
Author(s)
Johannes Stahr,M. Morianz,M. Brizoux,A. Grivon,W. Maia
Event
IPC APEX EXPO 2013

Embedded Passive Technology

Embedded Passive Technology is a viable technology that has been reliably used in the defense and aerospace industry for over 20 years. Embedded Passive (Resistors and Capacitors) Technology ha .. read more
Author(s)
Hikmat Chammas
Event
IPC APEX EXPO 2013

Warpage Optimization of Printed Circuit Boards with Embedded Active and Passive Components

Importance of the properties during curing: - Curing analysis has to be carried in a PCB level to improve understanding warpage mechanism. Specially it is very important in a laminating process .. read more
Author(s)
Seunghyun Cho,Ryan Park,Norbert Galster,Juergen Kress
Event
IPC APEX EXPO 2013

Insertion Loss Comparisons of Common High Frequency PCB Constructions

Printed Circuit Boards (PCB’s) have been used for many years in low loss,high frequency microwave applications and many of these circuits have become increasingly complex. Often these complex c .. read more
Author(s)
John Coonrod
Event
IPC APEX EXPO 2013

Influence of Via Stub Length and Antipad Size on the Insertion Loss Profile

The growing transmission speed and volume of digital content increases the pressure on reduction of overall insertion loss of printed circuit boards permanently. In today’s circuit boards,it is .. read more
Author(s)
Alexander Ippich
Event
IPC APEX EXPO 2013

Embedded System Access - a Paradigm Shift in Electrical Test

Throughout a product’s life cycle it may need to be tested various times. New product designs need to be validated during the prototyping phase,manufacturing defects need to be detected and dia .. read more
Author(s)
Heiko Ehrenberg,Thomas Wenzel
Event
IPC APEX EXPO 2013

Why Signal Always Be Loss in a High Speed Frequency Transmission Line

The high speed transmission applications in the electronic product become inevitable developing trend. The signal integrity becomes the most important issue in the electronic industry. The mate .. read more
Author(s)
Albert Chen
Event
IPC APEX EXPO 2013

Advanced Second Level Assembly Analysis Techniques - Troubleshooting Head-In-Pillow,Opens,and Shorts with Dual Full-Field 3D Surface Warpage Data Sets

SMT assembly planning and failure analysis of surface mount assembly defects often include component warpage evaluation. Coplanarity values of Integrated Circuit packages have traditionally bee .. read more
Author(s)
Ken Chiavone
Event
IPC APEX EXPO 2013

Head in Pillow X-ray Inspection at Flextronics

Manufacturing technology faces challenges with new packages/process when confronting the need for high yields. Identifying product defects associated with the manufacturing process is a critica .. read more
Author(s)
Alejandro Castellanos,Adalberto Gutierrez,Gilberto Martin,Matthew Vandiver,Ranga Dematampitiya,Hung Le,Elliott Le,Phuong Chau,Hao Cui,An Qi Zhao,Wei Bing Qian,Fuqing Li,Jacky Yao,Jiyang Zhang,Leonard Brisan,Cristian Gurka,Shane Young,Johann Bruenner,Martin Novak,Nadarajan M Singaram,Zhen (Jane) Feng,David Geiger,Murad Kurwa
Event
IPC APEX EXPO 2013

Online Databse of Materials for Printed Electronics

Materials Registry for Printed Electronics - WMU’s CAPE received an award from FlexTech Alliance to create an online database for accessing technical information on functional materials used in .. read more
Author(s)
Margaret K. Joyce,Erika Rebrosova,Massood Z. Atashbar,Marian Rebros
Event
IPC APEX EXPO 2013

Improving Yields and Quality: Two Case Studies: Graping and the Head-on-Pillow defect

HoP Mitigation is addressed with respect to solder paste,components,inspection,process and the environment. Graping minimization recommendations are given with data driven suggestions. .. read more
Author(s)
Ronald C. Lasky
Event
IPC APEX EXPO 2013

Gravure Printing of ITO Transparent Electrodes for Applications in Printed Electronics

ITO nanoparticles were successfully printed on glass with the AccuPress Gravure System •A wide range of sheet resistivity values was achieved with different engraving resolutions of the gravure .. read more
Author(s)
Dania Alsaid,Margaret Joyce,Erika Rebrosova,Marian Rebros,Massood Atashbar
Event
IPC APEX EXPO 2013

Printed & Flexible Electronics – Surf’s Up

Printed & Flexible Electronics • Development Waves – 1st,2nd,and 3rd • Essentials • Products and Applications • Technology and Infrastructure Development • Printed & Flexible Electronics Pipeli .. read more
Author(s)
Daniel Gamota
Event
IPC APEX EXPO 2013

Mixed Metals Impact on Reliability

With the adoption of RoHS and implementation of Lead Free solders a major concern is how this will impact reliability. Both commercial and military hardware are impacted by this change even tho .. read more
Author(s)
Rick Gunn
Event
IPC APEX EXPO 2013

Testing Intermetallic Fragility on Enig upon Addition of Limitless Cu

As reliability requirements increase,especially for defense and aerospace applications,the need to characterize components used in electronic assembly also increases. OEM and EMS companies look .. read more
Author(s)
Martin K. Anselm,Brian Roggeman
Event
IPC APEX EXPO 2013

Assessment of Reterminated RoHS Components for SnPb Applications

The banning of Pb in electronic component termination finishes has flushed through the supply chain making it impossible in some cases for hi-reliability users to purchase Pb containing interco .. read more
Author(s)
Chris Hunt,Martin Wickham,Ling Zou,Owen Thomas,Bufa Zhang
Event
IPC APEX EXPO 2013

The Coming of The MultiChip Module

MultiChip Module Status •It isn’t a new idea since back in the 1980’s everyone was trying to combine different components into a single package •It started with Hybrids then different forms of .. read more
Author(s)
Dieter Bergman
Event
IPC APEX EXPO 2013

BVA: Molded Cu Wire Contact Solution for Very High Density Package-on- Package (PoP) Applications

Stacking heterogeneous semiconductor die (memory and logic) within the same package outline can be considered for less complex applications but combining the memory and processor functions in a .. read more
Author(s)
Vern Solberg,Ilyas Mohammed
Event
IPC APEX EXPO 2013

Printed Circuit Structures,the Evolution of Printed Circuit Boards

The Printed Circuit Board (PCB) is the backbone of electronics and a large number of consumer devices. The challenge to put more function in a smaller space requires more components utilizing s .. read more
Author(s)
Kenneth H. Church,Harvey Tsang,Ricardo Rodriguez,Paul Defembaugh,Raymond Rumpf
Event
IPC APEX EXPO 2013

Cost effective 3D Glass Microfabrication for Advanced Electronic Packages

Interposer technologies are gathering more importance in IC packaging as the industry continues miniaturization trends in microfabrication nodes and IC packaging to meet design and utility need .. read more
Author(s)
Jeb H. Flemming,Kevin Dunn,James Gouker,Carrie Schmidt,Roger Cook
Event
IPC APEX EXPO 2013

TOF SIMS Analysis for SnxOy Determination on Lead-Free HASL PCB’s

During the production of Lead-Free Hot Air Solder Leveling (LF HASL),non-wetting issues in several components were found including BGA pad. The common visual aspect of the suspicious pads was t .. read more
Author(s)
José María Servín,Cynthia Gómez
Event
IPC APEX EXPO 2013

Improving Density in Microwave Multilayer Printed Circuit Boards for Space Applications

The need in complexity for microwave space products such as active BFNs (Beam Forming Networks) is increasing,with a significantly growing number of amplitude / phase control points (number of .. read more
Author(s)
David Névo,Olivier Vendier,Jean-Louis Cazaux,Jean-Luc Lortal
Event
IPC APEX EXPO 2013

Behavior of Materials in the Manufacturing Environment

This study was conducted to understand seven materials reliability,behavior of Dielectric constant and Dissipation factor over medium to high frequencies. A modified version of HDPUG design was .. read more
Author(s)
Hardeep Heer
Event
IPC APEX EXPO 2013

Nanomaterials Performance Advantages in Printed Electronics Addressing Implementation Issues

Nanotechnology is a key enabling technology for printed electronics. Low temperature reactivity,reaction speeds,flexibility and fine pitch considerations dictate that nanomaterials should be gi .. read more
Author(s)
Alan Rae
Event
IPC APEX EXPO 2013

Phototonic Curing: Broad Implications in Printed Electronics

•Photonic curing uses high-intensity flash lamps to selectively heat target materials. •The PulseForge tools are based on the patented use of photonic curing and are designed for use in develop .. read more
Author(s)
Kurt A. Shroder
Event
IPC APEX EXPO 2013

Development of Printed Flex Circuits

•Developments of Printed FPCs - PE resist for long FPCs - Flexible Touch Sensor Panel(TSP) application - Single-sided Printed FPCs - Double-sided Printed FPCs - Smart Printed FPCs .. read more
Author(s)
Hirofumi Matsumoto
Event
IPC APEX EXPO 2013

The Effects of Human-Induced Contamination on PCB Assembly Electrical Reliability

With the ever-present pressure toward miniaturization in electronic devices,smaller distances between traces and component terminations are likely to increase the devices’ sensitivity to contam .. read more
Author(s)
Eric Bastow
Event
IPC APEX EXPO 2013

Capillary IC – A New Platform for High Throughput or High Resolution Separations of Ionic Compounds

High pressure capillary IC allows you to: Lower operational costs – water,waste,consumables “Always Ready” Improved system and analytical performance Convenience Rush samples Enables high-resol .. read more
Author(s)
Peter Bodsky
Event
IPC APEX EXPO 2013

Cleanliness Assessment for Class III Lead-Free No-Clean Assemblies

For mission critical electronics or Class III products,such as those used within the military,aerospace and medical industries,highest electronic reliability is a requirement as failure is not .. read more
Author(s)
Umut Tosun,Ravi Parthasarathy,Michael McCutchen
Event
IPC APEX EXPO 2013

CO2 Clean Manufacturing Technology for Electronic Device Fabrication

CO2 technology offers electronic device manufacturers a robust platform for a variety of precision cleaning and machining applications. Surface and substrate contamination such as flux residues .. read more
Author(s)
David Jackson
Event
IPC APEX EXPO 2013

Electrical Test Conditions & Considerations

When testing PCBs it can be quite confusing as to what method to use,parameters are necessary for the Performance Class and what cost to associate in the build to way against the long term reli .. read more
Author(s)
Rick Meraw,Todd Kolmodin
Event
IPC APEX EXPO 2013

Hi Pot Dielectric Breakdown Automated Verification How-To

The Printed Circuit Board (PCB) builds get ever more complex. With this the layer counts climb but the overall thickness remains the same. From this the cores of the build are reduced and the d .. read more
Author(s)
Todd L Kolmodin
Event
IPC APEX EXPO 2013

Two Print Stencils Systems

The Two print stencils process has been a very useful tool in SMT Assembly and Package Assembly. It is also useful in Assemblies that require mixed technologies; including SMT / Through Hole,SM .. read more
Author(s)
William E. Coleman
Event
IPC APEX EXPO 2013

Profiled Squeegee Blade: Rewrites the Rules for Angle of Attack

For centuries,the squeegee blade has been used throughout many applications for depositing viscous materials through screens and stencils to transfer images on to substrates,from cloth material .. read more
Author(s)
Ricky Bennett,Rich Lieske,Corey Beech
Event
IPC APEX EXPO 2013

Evaluating the Accuracy of a Nondestructive Thermo Couple Attach Method for Area Array Package Profiling

The oven recipe,which consists of the reflow oven zone temperature settings and the speed of the conveyor,will determine a specific time-temperature profile for a given PCB assembly. In order t .. read more
Author(s)
S. Manian Ramkumar,Tim Grove
Event
IPC APEX EXPO 2013

Military Applications of Flexible Circuits

1.Conventional Flex 2.Basic Materials 3.Failure Modes 4.HDI Flex Summary,conventional builds Cautions in Design •Average or above Design Expertise Required –PTH to close to edge of part –Panel .. read more
Author(s)
Bradford Saunders
Event
IPC APEX EXPO 2013

Direct Determination of Phosphorus Content in Electroless Nickel Plating Using X-ray Fluorescence (XRF) Spectroscopy

Electroless plating processes are popular because of their performance,reliability and cost effectiveness. The process combines unique deposit properties such as uniform plating build up regard .. read more
Author(s)
Jim Bogert,Ryan Boyle,Volker Rößiger,Wolfgang Klöck
Event
IPC APEX EXPO 2013

Via Filling: Challenges for the Chemistry in the Plating Process

Copper filling of laser drilled blind micro vias (BMV´s) is now the standard production method for high density interconnects. Copper filled BMV´s are used as solder bump sites for IC packaging .. read more
Author(s)
Mike Palazzola,Nina Dambrowsky,Stephen Kenny
Event
IPC APEX EXPO 2013