Sources in A Production Line (SMT) and Solutions against ESD (Electrostatic Discharge) - Requirements Today and In The Future
The structures of electronic components become smaller and smaller. 5 volts or smaller voltage of an electrostatic charge are enough to damage or change the structures in small electronic compo
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Event
IPC APEX EXPO 2013
Big Ideas on Miniaturisation
The next generation miniaturised SMT devices waiting to make their mark will require the assembly community to re think their processes and toolsets. The feature sizes that are involved in this
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Event
IPC APEX EXPO 2013
Low Surface Energy Coatings,Rewrites the Area Ratio Rules
Paste release characteristics are driven by the Area Ratio formula,which is based upon conventional stencil foil materials such as a variety of stainless steel alloys,nickel,etc. The surface en
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Event
IPC APEX EXPO 2013
Printing and Assembly Challenges for QFN Devices
Although QFN devices present a challenge to the SMT assembly process with proper stencil design,proper stencil technology selection (Laser,Electroform,Nano-Coat),and proper PCB solder mask layo
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Event
IPC APEX EXPO 2013
Reliability Performance of Very Thin Printed Circuit Boards with regard to Different any-Layer Manufacturing Technologies
The next generation of smart phones will demand very thin multi-layer boards to reduce the product thickness again. This paper shows three different manufacturing approaches,which can be used f
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Event
IPC APEX EXPO 2013
Controlling Moisture During Inner Layer Processing
•Two primary failure modes from trapped moisture:
•Premature resin decomposition from incomplete resin cross-linking.
•Explosive vaporization during high temperature thermal exposure.
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Event
IPC APEX EXPO 2013
Micro Trace Resistive Technology
Micro Trace Resistor Technology allows thin film resistors to be built within a printed circuit trace that is less than 100 microns wide. Using standard subtractive printed circuit board proces
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Event
IPC APEX EXPO 2013
Effect of Toughening and E-Glass Sizing on Fracture Toughness and Delamination in High Thermal Stability Electrical Laminates
In this work we report results of the fracture toughness of a high thermal stability resin system toughened by The Dow Chemical Company proprietary particulate-type toughening material. Results
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Event
IPC APEX EXPO 2013
QFN Voiding Control Via Solder Mask Patterning On Thermal Pad
•Voiding of QFN a concern due to large thermal pad,low standoff,and many thermal via
•Divided thermal pad preferred,with SMD better than NSMD
•This work focus on systematic study on effect of S
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Event
IPC APEX EXPO 2013
Fluxless Die Attach by Activated Forming Gas
Eutectic god-tin (Au80Sn20) is widely used as the die-attach material for making radio-frequency (RF) and microwave devices. The metallic bonding is typically achieved by soldering using a gold
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Event
IPC APEX EXPO 2013
Building HDI Structures using Thin Films and Low Temperature Sintering Paste
Circuit complexity and density requirements continue to push PCB fabrication capability limits. Component pitch and routing requirements are continually becoming more aggressive and difficult t
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Event
IPC APEX EXPO 2013
Exploring the High Temperature Reliability Limits for Silicone Adhesives
The thermal stability of silicone polymers,fluids and resins has been well documented and studied extensively. The high temperature performance of silicone adhesives and sealants used for elect
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Event
IPC APEX EXPO 2013
Plasma Polymerization: A Versatile and Attractive Process for Conformal Coating
The use of plasma processing in the manufacture of electronics is growing as we discover more and more applications for this technology. It is now common for plasma etching and cleaning to be u
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Event
IPC APEX EXPO 2013
Mobile Electronics,How to Protect Internal Circuitry from A Harsh Environment
The portable electronics market has driven steep-slope growth for over a decade and continues to deliver amazing handheld electronic devices; manufacturers of these products are facing challeng
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Event
IPC APEX EXPO 2013
Evaluating Corrosion Resistance of Ceramic Resistors: Mixed Flowing Gas versus Flower of Sulfur Tests
Multi-layer organic laminates which make up over 90% of the present types of interconnecting substrates in today’s electronics can develop a loss of insulation resistance between two biased con
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Event
IPC APEX EXPO 2013
New High-Performance Organophosphorus Flame Retardant
A new non-halogen flame retardant has been developed and is useful for a variety of high performance applications. This
non-reactive phosphorus-based material satisfies fire safety needs for a
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Event
IPC APEX EXPO 2013
Qualification of Solder Beading and Tombstoning in Passive Devices using Designed Experiments
Solder beading and tombstoning are observed increasingly with chip components as their size decreases. This is
even more crucial in today’s packaging,due to the high ratio of passive components
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Event
IPC APEX EXPO 2013
Potential Global Warming Contribution from a Typical Electronics
Examination of historical data for a defunct electronics manufacturing plant in Ontario,Canada has allowed the
determination of the potential global warming contribution by the plant for the ye
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Event
IPC APEX EXPO 2013
Cleaning in an HDI World
Electronic assembly innovations drive more performance using highly dense interconnects. Assembly residues may increase the risk of premature failure or improper functionality. The challenge fo
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Event
IPC Midwest 2012
QFN Flux Entrapment Case Study
The presentation will discuss the problems that many QFN users are dealing with by having flux trapped under the component that is still gooey and conductive and the effect on circuit performan
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Event
IPC Midwest 2012
Printing and Assembly Challenges for QFN Devices
QFN’s offer advantages in reducing size and weight and have excellent thermal and electrical Conductivity related to the ground plane. QFN’s also present printing and assembly challenges includ
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Event
IPC Midwest 2012
Pad Cratering
Lead-free assembly has introduced many challenges and non-conformances. One of the more troubling non-conformances is “Pad Cratering”. Pad cratering is when the copper pad completely separates
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Event
IPC Midwest 2012
Consideration for Selection and Implementation of Low VOC Conformal Coating into High Reliability Electronics Manufacturing Operation
The purpose of this presentation is to provide considerations for selection of conformal coatings into electronics assembly operations. The types of testing required for selection and use of co
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Event
IPC Midwest 2012
Multifunctional Nanocomposite Liquid-Repellent Coatings/Films for the Electronics Industry
Recent advances in polymer science and nanomaterials have fueled a frenzy of scientific activity in multifunctional coatings and films. This rich subject area encompasses several scientific dis
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Event
IPC Midwest 2012
Lead Free Die Attach Technology for High Power Applications
TLPS materials are an attractive alternative to PbSn for IC power device packaging. They provide a low VOC composition,lead free die attach solution that meets the RoHS guidelines. TLPS materia
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Event
IPC Midwest 2012
Capillary IC – A New Platform for High Throughput or High Resolution Separations of Ionic Compounds
There has been increasing interest in the development of capillary ion chromatography (IC) systems and methods for determination of ionic species. The practice of ion chromatography in capillar
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Event
IPC Midwest 2012
Moisture Diffusion in Electronic Packaging Materials
Moisture poses a significant threat to the reliability of microelectronic assemblies,especially for scientific research products that are designed for marine environment and can be attributed a
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Event
IPC Midwest 2012
Is the ENIG Process Evil,or is it Maybe QA,Engineer or Sales Guy?
The case of processing issues with Electroless Nickel/Immersion Gold (ENIG) is well documented,even as it endures as a very popular surface finish. Certainly the market says that quality ENIG h
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Event
IPC Midwest 2012
Jetting Solder Paste Opens Up New Possibilities in Your SMT Production
Jetting of liquids is becoming the standard in our industry. MYDATA has developed a unique tool to jet solder paste. This non-contact method of applying solder paste has a large number of advan
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Event
IPC Midwest 2012
NPI Step Stencils- A New Approach
There are a variety of stencil approaches in which the new product process engineer can deal with the assembly of both high solder paste and low solder paste volume in an SMT assembly environme
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Event
IPC Midwest 2012
Dual Solvent Electronic Assembly Cleaning
Electronic Assemblies are cleaned in order to remove contaminations that may affect yields,service life and reliability. Highly dense interconnects entrap flux residues under the Z-axis. Volati
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Event
IPC Midwest 2012
Reflow Soldering Equals Wave Soldering Plus One
Lead-free solder is more than a swap for SnPb and more than simply an alternative alloy. Five years after implementation discussion remains regarding which alloy is the best for which applicati
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Event
IPC Midwest 2012
The Effect of Powder Surface Area and Oxidation on the Voiding Performance of PoP Solder Pastes
With the miniaturization of components in the semiconductor industry,the need for specialized solder pastes with finer powder mesh sizes for package-on-package (PoP) assemblies has become imper
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Event
IPC Midwest 2012
New Developments in PCB Laminates
Executive Summary
There are many issues to consider when developing a new circuit material for the PCB industry. It is a given assumption that the new material must be compatible to standard PC
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Event
IPC Midwest 2012
Environmental Compliance Reporting – Mastering a Moving Target
Companies that have initiated internal resources to obtain compliance data have realized that collecting,and more importantly,maintaining the currency of that data requires more resources than
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Event
IPC APEX EXPO 2012
Scaling LCA with IPC-175x
- Live Cycle Assessment
- Early Product Analysis / “DFX” Challenge
- Keys to Scaling #1: Processes and Systems
- Systems can Extend “Traditional” LCA
- Keys to Scaling #2: Data Exchange Standar
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Event
IPC APEX EXPO 2012
An Investigation of Whisker Growth on Tin Coated Wire and Braid
Pure tin is a common finish for copper hook up wire,coaxial cable,ground braid and harness assemblies used on electronic assemblies. Historically there have been fewer reports of whisker growth
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Event
IPC APEX EXPO 2012
Elemental Compositions of Over Two Dozen Cell Phones
Twenty-nine different cells phones have been disassembled,ground up,dissolved and analyzed for elemental content,mainly for information about the metals present in the phones,but also for some
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Event
IPC APEX EXPO 2012
Growth Mechanisms of Tin Whiskers at Press-in Technology
Compliant press-fit zones apply external mechanical stress to copper and tin surfaces of plated through holes at printed circuit boards during and after performing the press-in process. This ex
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Event
IPC APEX EXPO 2012
Effects of Tin and Copper Nanotexturization on Tin Whisker Formation
The physical mechanisms behind tin whisker formation in pure tin (Sn) films continue to elude the microelectronics industry. Despite modest advances in whisker mitigation techniques (i.e.,barri
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Event
IPC APEX EXPO 2012
Integrated Electrical Test within the Production Line
Many companies use “one stop testing” as a solution to the test issues in a manufacturing environment rather than discrete
“islands of test”. Low volume,high mix electronic manufactures are con
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Event
IPC APEX EXPO 2012
Effective Test-Probe Assignment on PCB Electrical Testing
Test point optimization for the PCB electrical test domain brings the test speed faster for the flying probe tester (FPT),
and the fixture cost lower for the fixture type tester. The importance
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Event
IPC APEX EXPO 2012
Novel Probing Concepts for Mass-Production Tests: Design and Challenges
The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro mobility appli
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Event
IPC APEX EXPO 2012
Reduction of Voids in Solder Joints an Alternative to Vacuum Soldering
Voids in solder joints are representing one of the main problems especially for power electronics. A low and homogeneous
thermal resistance of solder joints is demanded for a quick and uniform
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Event
IPC APEX EXPO 2012
Thermal Cycle Reliability Study of Vapor Phase BGA Solder Joints
Prior to committing production boards to vapor phase soldering,we performed an evaluation to assess reliability and evaluate the vacuum soldering option. The reliability of vapor phase processe
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Event
IPC APEX EXPO 2012
Before & After Reflow Characterization of FCBGA Voiding Utilizing High Resolution CT Scan,X-ray (2D & 3D) Imaging,and Cross Section with Digital Imaging
A joint project between Flextronics Inc. and North Star Imaging Inc. is being conducted to correlate current x-ray imaging and cross-section analysis of BGA voiding with state of the art high r
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Event
IPC APEX EXPO 2012
A Time Dependent Analytical Analysis of Heat Transfer in A PCB during A Thermal Excursion
A great deal of work has already been done to determine the equilibrium temperature of a PCB when exposed to a heat source such as the thermal environment of reflow soldering. This study will g
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Event
IPC APEX EXPO 2012
A New Paradigm for Design through Manufacture
Working through the New Product Introduction (NPI) flow between the product design and manufacturing is usually a challenging process,with both parties being experts in their own fields and ine
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Event
IPC APEX EXPO 2012