Welcome to IPC's collection of technical papers presented at conferences since 2002. You can search by author, title and keyword. You can also search for keywords and topics in the Tag field. Access to the papers is reserved for IPC members.

Sources in A Production Line (SMT) and Solutions against ESD (Electrostatic Discharge) - Requirements Today and In The Future

The structures of electronic components become smaller and smaller. 5 volts or smaller voltage of an electrostatic charge are enough to damage or change the structures in small electronic compo .. read more
Author(s)
Hartmut Berndt
Event
IPC APEX EXPO 2013

Big Ideas on Miniaturisation

The next generation miniaturised SMT devices waiting to make their mark will require the assembly community to re think their processes and toolsets. The feature sizes that are involved in this .. read more
Author(s)
Clive Ashmore,Mark Whitmore,Jeff Schake
Event
IPC APEX EXPO 2013

Low Surface Energy Coatings,Rewrites the Area Ratio Rules

Paste release characteristics are driven by the Area Ratio formula,which is based upon conventional stencil foil materials such as a variety of stainless steel alloys,nickel,etc. The surface en .. read more
Author(s)
Ricky Bennett,Eric Hanson
Event
IPC APEX EXPO 2013

Printing and Assembly Challenges for QFN Devices

Although QFN devices present a challenge to the SMT assembly process with proper stencil design,proper stencil technology selection (Laser,Electroform,Nano-Coat),and proper PCB solder mask layo .. read more
Author(s)
Rachel Short
Event
IPC APEX EXPO 2013

Reliability Performance of Very Thin Printed Circuit Boards with regard to Different any-Layer Manufacturing Technologies

The next generation of smart phones will demand very thin multi-layer boards to reduce the product thickness again. This paper shows three different manufacturing approaches,which can be used f .. read more
Author(s)
Thomas Krivec,Gerhard Schmid,Martin Fischeneder,Gerhard Stoiber
Event
IPC APEX EXPO 2013

Controlling Moisture During Inner Layer Processing

•Two primary failure modes from trapped moisture: •Premature resin decomposition from incomplete resin cross-linking. •Explosive vaporization during high temperature thermal exposure. .. read more
Author(s)
John A. Marshall
Event
IPC APEX EXPO 2013

Micro Trace Resistive Technology

Micro Trace Resistor Technology allows thin film resistors to be built within a printed circuit trace that is less than 100 microns wide. Using standard subtractive printed circuit board proces .. read more
Author(s)
Bruce P. Mahler
Event
IPC APEX EXPO 2013

Effect of Toughening and E-Glass Sizing on Fracture Toughness and Delamination in High Thermal Stability Electrical Laminates

In this work we report results of the fracture toughness of a high thermal stability resin system toughened by The Dow Chemical Company proprietary particulate-type toughening material. Results .. read more
Author(s)
Lameck Banda,Bill Mercer,Mark Wilson,Robert Hearn,Michael Mullins,George Piotrowski,Tab Bates,Shobha Murari
Event
IPC APEX EXPO 2013

QFN Voiding Control Via Solder Mask Patterning On Thermal Pad

•Voiding of QFN a concern due to large thermal pad,low standoff,and many thermal via •Divided thermal pad preferred,with SMD better than NSMD •This work focus on systematic study on effect of S .. read more
Author(s)
Derrick Herron,Yan Liu,Ning-Cheng Lee
Event
IPC APEX EXPO 2013

Fluxless Die Attach by Activated Forming Gas

Eutectic god-tin (Au80Sn20) is widely used as the die-attach material for making radio-frequency (RF) and microwave devices. The metallic bonding is typically achieved by soldering using a gold .. read more
Author(s)
C. Christine Dong,Russell A. Siminski
Event
IPC APEX EXPO 2013

Building HDI Structures using Thin Films and Low Temperature Sintering Paste

Circuit complexity and density requirements continue to push PCB fabrication capability limits. Component pitch and routing requirements are continually becoming more aggressive and difficult t .. read more
Author(s)
Catherine Shearer,James Haley,Chris Hunrath
Event
IPC APEX EXPO 2013

Exploring the High Temperature Reliability Limits for Silicone Adhesives

The thermal stability of silicone polymers,fluids and resins has been well documented and studied extensively. The high temperature performance of silicone adhesives and sealants used for elect .. read more
Author(s)
Carlos Montemayor
Event
IPC APEX EXPO 2013

Plasma Polymerization: A Versatile and Attractive Process for Conformal Coating

The use of plasma processing in the manufacture of electronics is growing as we discover more and more applications for this technology. It is now common for plasma etching and cleaning to be u .. read more
Author(s)
Andy Brooks,Siobhan Woollard,Gareth Hennighan,Elizabeth Duncan,Tim von Werne
Event
IPC APEX EXPO 2013

Mobile Electronics,How to Protect Internal Circuitry from A Harsh Environment

The portable electronics market has driven steep-slope growth for over a decade and continues to deliver amazing handheld electronic devices; manufacturers of these products are facing challeng .. read more
Author(s)
Hector Pulido
Event
IPC APEX EXPO 2013

The Black Swan Effect in Military Applications

#NAME? .. read more
Author(s)
Jack Stradley
Event
IPC APEX EXPO 2013

Evaluating Corrosion Resistance of Ceramic Resistors: Mixed Flowing Gas versus Flower of Sulfur Tests

Multi-layer organic laminates which make up over 90% of the present types of interconnecting substrates in today’s electronics can develop a loss of insulation resistance between two biased con .. read more
Author(s)
Bhanu Sood,Michael Osterman
Event
IPC APEX EXPO 2013

New High-Performance Organophosphorus Flame Retardant

A new non-halogen flame retardant has been developed and is useful for a variety of high performance applications. This non-reactive phosphorus-based material satisfies fire safety needs for a .. read more
Author(s)
Kimberly M. White,Daniel De Schryver,Randy Chaya
Event
IPC APEX EXPO 2013

The Role and Future of

Author(s)
John H. Lau
Event
IPC APEX EXPO 2013

Qualification of Solder Beading and Tombstoning in Passive Devices using Designed Experiments

Solder beading and tombstoning are observed increasingly with chip components as their size decreases. This is even more crucial in today’s packaging,due to the high ratio of passive components .. read more
Author(s)
Vijaykumar Ganeshan,Karthik Thenalur,S. Manian Ramkumar
Event
IPC APEX EXPO 2013

Potential Global Warming Contribution from a Typical Electronics

Examination of historical data for a defunct electronics manufacturing plant in Ontario,Canada has allowed the determination of the potential global warming contribution by the plant for the ye .. read more
Author(s)
Bev Christian,Tracey Forrest
Event
IPC APEX EXPO 2013

Cleaning in an HDI World

Electronic assembly innovations drive more performance using highly dense interconnects. Assembly residues may increase the risk of premature failure or improper functionality. The challenge fo .. read more
Author(s)
Mark Northrup,Joe Russeau,Mike Bixenman
Event
IPC Midwest 2012

QFN Flux Entrapment Case Study

The presentation will discuss the problems that many QFN users are dealing with by having flux trapped under the component that is still gooey and conductive and the effect on circuit performan .. read more
Author(s)
Terry Munson
Event
IPC Midwest 2012

Printing and Assembly Challenges for QFN Devices

QFN’s offer advantages in reducing size and weight and have excellent thermal and electrical Conductivity related to the ground plane. QFN’s also present printing and assembly challenges includ .. read more
Author(s)
William E. Coleman
Event
IPC Midwest 2012

Pad Cratering

Lead-free assembly has introduced many challenges and non-conformances. One of the more troubling non-conformances is “Pad Cratering”. Pad cratering is when the copper pad completely separates .. read more
Author(s)
Trey Adams
Event
IPC Midwest 2012

Consideration for Selection and Implementation of Low VOC Conformal Coating into High Reliability Electronics Manufacturing Operation

The purpose of this presentation is to provide considerations for selection of conformal coatings into electronics assembly operations. The types of testing required for selection and use of co .. read more
Author(s)
Douglas O. Pauls
Event
IPC Midwest 2012

Multifunctional Nanocomposite Liquid-Repellent Coatings/Films for the Electronics Industry

Recent advances in polymer science and nanomaterials have fueled a frenzy of scientific activity in multifunctional coatings and films. This rich subject area encompasses several scientific dis .. read more
Author(s)
Constantine M. Megaridis
Event
IPC Midwest 2012

Lead Free Die Attach Technology for High Power Applications

TLPS materials are an attractive alternative to PbSn for IC power device packaging. They provide a low VOC composition,lead free die attach solution that meets the RoHS guidelines. TLPS materia .. read more
Author(s)
Michael Matthews,Ken Holcomb,Jim Haley,Rick Weaver,ES Barber,Catherine Shearer
Event
IPC Midwest 2012

Capillary IC – A New Platform for High Throughput or High Resolution Separations of Ionic Compounds

There has been increasing interest in the development of capillary ion chromatography (IC) systems and methods for determination of ionic species. The practice of ion chromatography in capillar .. read more
Author(s)
Peter Bodsky
Event
IPC Midwest 2012

Moisture Diffusion in Electronic Packaging Materials

Moisture poses a significant threat to the reliability of microelectronic assemblies,especially for scientific research products that are designed for marine environment and can be attributed a .. read more
Author(s)
Junaid Shafaat
Event
IPC Midwest 2012

Is the ENIG Process Evil,or is it Maybe QA,Engineer or Sales Guy?

The case of processing issues with Electroless Nickel/Immersion Gold (ENIG) is well documented,even as it endures as a very popular surface finish. Certainly the market says that quality ENIG h .. read more
Author(s)
Chris Mahanna
Event
IPC Midwest 2012

Jetting Solder Paste Opens Up New Possibilities in Your SMT Production

Jetting of liquids is becoming the standard in our industry. MYDATA has developed a unique tool to jet solder paste. This non-contact method of applying solder paste has a large number of advan .. read more
Author(s)
Nico Coenen
Event
IPC Midwest 2012

NPI Step Stencils- A New Approach

There are a variety of stencil approaches in which the new product process engineer can deal with the assembly of both high solder paste and low solder paste volume in an SMT assembly environme .. read more
Author(s)
Jim French,Bob Wettermann
Event
IPC Midwest 2012

Dual Solvent Electronic Assembly Cleaning

Electronic Assemblies are cleaned in order to remove contaminations that may affect yields,service life and reliability. Highly dense interconnects entrap flux residues under the Z-axis. Volati .. read more
Author(s)
Mike Bixenman,Joe McChesney
Event
IPC Midwest 2012

Reflow Soldering Equals Wave Soldering Plus One

Lead-free solder is more than a swap for SnPb and more than simply an alternative alloy. Five years after implementation discussion remains regarding which alloy is the best for which applicati .. read more
Author(s)
Gerjan Diepstraten
Event
IPC Midwest 2012

The Effect of Powder Surface Area and Oxidation on the Voiding Performance of PoP Solder Pastes

With the miniaturization of components in the semiconductor industry,the need for specialized solder pastes with finer powder mesh sizes for package-on-package (PoP) assemblies has become imper .. read more
Author(s)
Mario Scalzo,Brandon Judd
Event
IPC Midwest 2012

New Developments in PCB Laminates

Executive Summary There are many issues to consider when developing a new circuit material for the PCB industry. It is a given assumption that the new material must be compatible to standard PC .. read more
Author(s)
John Coonrod,Dean Hattula
Event
IPC Midwest 2012

Environmental Compliance Reporting – Mastering a Moving Target

Companies that have initiated internal resources to obtain compliance data have realized that collecting,and more importantly,maintaining the currency of that data requires more resources than .. read more
Author(s)
Peter Robinson
Event
IPC APEX EXPO 2012

Scaling LCA with IPC-175x

- Live Cycle Assessment - Early Product Analysis / “DFX” Challenge - Keys to Scaling #1: Processes and Systems - Systems can Extend “Traditional” LCA - Keys to Scaling #2: Data Exchange Standar .. read more
Author(s)
Jørgen Vos
Event
IPC APEX EXPO 2012

An Investigation of Whisker Growth on Tin Coated Wire and Braid

Pure tin is a common finish for copper hook up wire,coaxial cable,ground braid and harness assemblies used on electronic assemblies. Historically there have been fewer reports of whisker growth .. read more
Author(s)
Dave Hillman,Tim Pearson,Thomas Lesniewski
Event
IPC APEX EXPO 2012

Elemental Compositions of Over Two Dozen Cell Phones

Twenty-nine different cells phones have been disassembled,ground up,dissolved and analyzed for elemental content,mainly for information about the metals present in the phones,but also for some .. read more
Author(s)
Bev Christian,Irina Romanova,Laura Turbini
Event
IPC APEX EXPO 2012

Growth Mechanisms of Tin Whiskers at Press-in Technology

Compliant press-fit zones apply external mechanical stress to copper and tin surfaces of plated through holes at printed circuit boards during and after performing the press-in process. This ex .. read more
Author(s)
Hans-Peter Tranitz,Sebastian Dunker
Event
IPC APEX EXPO 2012

Effects of Tin and Copper Nanotexturization on Tin Whisker Formation

The physical mechanisms behind tin whisker formation in pure tin (Sn) films continue to elude the microelectronics industry. Despite modest advances in whisker mitigation techniques (i.e.,barri .. read more
Author(s)
David M. Lee,Lesly A. Piñol
Event
IPC APEX EXPO 2012

Integrated Electrical Test within the Production Line

Many companies use “one stop testing” as a solution to the test issues in a manufacturing environment rather than discrete “islands of test”. Low volume,high mix electronic manufactures are con .. read more
Author(s)
Michael Smith
Event
IPC APEX EXPO 2012

Effective Test-Probe Assignment on PCB Electrical Testing

Test point optimization for the PCB electrical test domain brings the test speed faster for the flying probe tester (FPT), and the fixture cost lower for the fixture type tester. The importance .. read more
Author(s)
Takeo Negishi
Event
IPC APEX EXPO 2012

Novel Probing Concepts for Mass-Production Tests: Design and Challenges

The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro mobility appli .. read more
Author(s)
Matthias Zapatka,Otmar Fischer,Sven Nocher
Event
IPC APEX EXPO 2012

Reduction of Voids in Solder Joints an Alternative to Vacuum Soldering

Voids in solder joints are representing one of the main problems especially for power electronics. A low and homogeneous thermal resistance of solder joints is demanded for a quick and uniform .. read more
Author(s)
Rolf Diehm,Mathias Nowottnick,Uwe Pape
Event
IPC APEX EXPO 2012

Thermal Cycle Reliability Study of Vapor Phase BGA Solder Joints

Prior to committing production boards to vapor phase soldering,we performed an evaluation to assess reliability and evaluate the vacuum soldering option. The reliability of vapor phase processe .. read more
Author(s)
Ward Gatza,Tom Evans
Event
IPC APEX EXPO 2012

Before & After Reflow Characterization of FCBGA Voiding Utilizing High Resolution CT Scan,X-ray (2D & 3D) Imaging,and Cross Section with Digital Imaging

A joint project between Flextronics Inc. and North Star Imaging Inc. is being conducted to correlate current x-ray imaging and cross-section analysis of BGA voiding with state of the art high r .. read more
Author(s)
Gordon O’Hara,Matthew Vandiver,Jonathan Crilly,Nick Brinkhoff
Event
IPC APEX EXPO 2012

A Time Dependent Analytical Analysis of Heat Transfer in A PCB during A Thermal Excursion

A great deal of work has already been done to determine the equilibrium temperature of a PCB when exposed to a heat source such as the thermal environment of reflow soldering. This study will g .. read more
Author(s)
J. Lee Parker
Event
IPC APEX EXPO 2012

A New Paradigm for Design through Manufacture

Working through the New Product Introduction (NPI) flow between the product design and manufacturing is usually a challenging process,with both parties being experts in their own fields and ine .. read more
Author(s)
Michael Ford
Event
IPC APEX EXPO 2012