Welcome to IPC's collection of technical papers presented at conferences since 2002. You can search by author, title and keyword. You can also search for keywords and topics in the Tag field. Access to the papers is reserved for IPC members.

MEMS-Based Microsystem Packaging

Sandia National Laboratories has programs covering the range of MEMS technologies from LIGA to bulk to surface micromachining. These MEMS technologies are being considered for an equally broad .. read more
Author(s)
Jonathan S. Custer
Event
IPC APEX 2003

ESD – Steps Against Electrostatic Discharge – Prevention of Electronic Devices and Assemblies

Electronic devices become more and more smaller. Electronic assemblies are sensitive against electrostatic discharge just as much as its smallest and most sensitive element. So protection syste .. read more
Author(s)
Dipl.-Ing. Hartmut Berndt
Event
IPC APEX 2003

State of the Art Detection and Analysis of Outgassed compounds for the Optoelectronics and Micro Assembly Industries

The outgassing level of materials (such as adhesives,composites,plastics,etc.) that are used to assemble and construct optoelectronic packages,sub-assemblies,and other electronic materials is b .. read more
Author(s)
John C. Hulteen
Event
IPC APEX 2003

Optical Switch Packaging Wire-bonding and Encapsulation Approaches

The trend in optical communications is toward all-optical Networks,which transmit,manage and route traffic over extended distances in the optical domain,without the need for power-hungry and ba .. read more
Author(s)
Val Alexandre,Basse Thierry,Salagoïty Michel
Event
IPC APEX 2003

Enhancement of CSP Mechanical Strength using Underfill or Bonding Material

Underfill technology has been used to minimize the mismatch of the Coefficient of Thermal Expansion (CTE) in flip chip technology. An extension of this application has been used to increase the .. read more
Author(s)
Sunny Zhang,Christina Chen,Shelgon Yee,AiChyun Shiah
Event
IPC APEX 2003

Implementation of No-Flow Underfills on Chip Scale Packages

Chip Scale Package (CSP) technology is growing at a rapid pace since its emergence in the electronics manufacturing industry. As the solder joint size decreases,it has become apparent that unde .. read more
Author(s)
Corey B. Franzo,Daniel F. Baldwin
Event
IPC APEX 2003

A Technique for Improving the Yields of Fine Feature Prints

A technique that enhances the release of solder paste from stencils during the print process has been developed. The technique is based on applying variable high frequency and low amplitude vib .. read more
Author(s)
Gerald Pham-Van-Diep,Frank Andres
Event
IPC APEX 2003

The Bumping of Wafer Level Packages

The relentless trend for smaller,lighter,cheaper consumer products continues to fuel the demand for new,smaller, efficient electronic packages. In recent years wafer level packaging concepts ha .. read more
Author(s)
Mark A Whitmore,Michael A Staddon,Jeffrey D Schake
Event
IPC APEX 2003

Optimization Study for Solder Pastes Used in Wafer Bumping Applications

Solder paste for use in wafer bumping applications is becoming an extremely viable technology. Yields from solder paste printing applications are approaching that of typical bumping technologie .. read more
Author(s)
Maureen Brown,Fritz Byle
Event
IPC APEX 2003

Optimizing the Supply Chain with Returnable Packaging: Solutions to Improve Profitability in the Electronics Industry

In the complex electronics industry,supply chain costs can have a major impact on a company’s profitability. Like the industrial supply chain,where costs are estimated to account for as much as .. read more
Author(s)
Andy Schumacher
Event
IPC APEX 2003

Stencil Printing Studies

Today’s SMT assemblies are being driven toward SMD’s with higher lead densities as well as smaller packages. This places additional performance requirements on the printing process. The stencil .. read more
Author(s)
William E. Coleman
Event
IPC APEX 2003

Defining Solder Paste Performance via Novel Quantitative Methods

Quantitative solder paste performance or use testing enables material formulators to focus on and maximize key material traits such as wettability and printability. These same material test met .. read more
Author(s)
Richard Lathrop
Event
IPC APEX 2003

Print Process Characterization for Fine Pitch Area Array Packages using Taguchi Techniques

The trend in electronics packaging towards product miniaturization,has forced the industry to use fine pitch area array packages instead of fine pitch leaded packages. These area array packages .. read more
Author(s)
Karthik Thenalur,Vijaykumar Ganeshan,S. Manian Ramkumar,
Event
IPC APEX 2003

Qualification of Solder Beading and Tombstoning in Passive Devices using Designed Experiments

Solder beading and tombstoning are observed increasingly with chip components as their size decreases. This is even more crucial in today’s packaging,due to the high ratio of passive components .. read more
Author(s)
Vijaykumar Ganeshan,Karthik Thenalur,S. Manian Ramkumar
Event
IPC APEX 2003

A Materials Based Solution for the Elimination of Tombstones

The drive for electronic devices to become lightweight,more portable,and posses increased functionality has driven electronic components to smaller and smaller sizes. This decease in size does .. read more
Author(s)
Brian J. Toleno,Neil Poole
Event
IPC APEX 2003

Evaluating the Use of Next Generation Reflow Profile Control for High Volume Electronics Manufacturing

In recent years,technological advances in electronics manufacturing have allowed high volume manufacturers to significantly improve process control and documentation. Manufacturers have acceler .. read more
Author(s)
John L. Evans,Bjorn Dahle
Event
IPC APEX 2003

Extending the Power of Boundary-Scan: System-Level Testing

Boundary-scan has achieved many of the goals envisioned by its original architects and today is in use in thousands of production facilities around the world to test complex digital printed cir .. read more
Author(s)
Raymond Dellecker,Pete Collins
Event
IPC APEX 2003

A Boundary-Scan Infrastructure for Linking Design and Manufacturing Test

This paper will discuss: a. Boundary scan as a key test tool that enables the leveraged test approach b. The advantages of standardizing and reusing design verification tests and PLD programs i .. read more
Author(s)
Raymond J. Balzer,Adam W. Ley
Event
IPC APEX 2003

Investigation of the Effectiveness of Automated X-ray Inspection Systems in a High Volume – Low Mix SMT Line

The advent of miniature surface mount components coupled with increasing lead counts has posed tremendous challenges during assembly. This is especially true in an Electronics Manufacturing Ser .. read more
Author(s)
Praveen Kumar Manjeshwar,Sachin Phadnis,K. Srihari,Jorge Craik
Event
IPC APEX 2003

Comparison of X-ray Inspection Systems for BGA/CCGA Quality Assurance and Crack Detection

For high reliability applications,the use of x-ray technique has become an additional inspection requirement for quality control and detection of unique defects due to manufacturing of advanced .. read more
Author(s)
R. Ghaffarian,D. Mih
Event
IPC APEX 2003

A Case Study of In-Process Inspection Methods to Improve First Pass Yields

The electronics content of many consumer products has increased substantially over the past decade. Several of the electronics added to the automobile control vehicle functions that have a dire .. read more
Author(s)
Stacey Wagner,David Clark
Event
IPC APEX 2003

Management of DPMO Metrics Reduces the Cost of PCB Assembly

Manufacturers can use DPMO metrics to reduce the cost of PCB assembly with fewer resources. DPMO data can be used for predicting the fault spectrum on future products,quoting new business,setti .. read more
Author(s)
Amit Verma
Event
IPC APEX 2003

Increasing Operating Margins in a Down Economy: Case Studies in SMT Production Monitoring Software & Applications

Shrinking profits and overcapacity have forced Electronics Manufacturers to squeeze every last penny out of Site Operations. To reduce conversion costs in a short timeframe,some facilities have .. read more
Author(s)
Dan Kauss
Event
IPC APEX 2003

Manufacturing Process Management – Facilitating Stage 3 of Manufacturing Outsourcing

The slowdown in the electronics industry has allowed the management of electronics products manufacturers to dedicate time to reconsider their manufacturing strategy. For most of these companie .. read more
Author(s)
Sharron Lifshitz
Event
IPC APEX 2003

Increased Productivity in X-ray Inspection – The Role of ADR Technology

The economic environment in the electronics industry has changed dramatically over the last two years. The focus on the production floor has moved from increasing capacity to improving the yiel .. read more
Author(s)
Vikram Butani
Event
IPC APEX 2003

Biologically Inspired Vision Makes for Smarter PCBA Manufacturing Technology - New Technologies Overcome Fundamental Limitations of Conventional Optical Inspection Methods

For test engineers and managers,automated optical inspection (AOI) systems have emerged as a countermeasure to the growing threats of lost physical or electrical access to assembled PCB. AOI sy .. read more
Author(s)
John Arena,Pamela Lipson
Event
IPC APEX 2003

2D Off-line X-ray Inspection in the SMT Production Line: Working Towards the Zero-Defect Goal

The goal of SMT production is a zero-defect process in which flawed materials never get to the customer; however, in the ideal scenario,zero-defect production would mean that no flawed products .. read more
Author(s)
Jon Dupree
Event
IPC APEX 2003

Practical Implementation of Lead-Free Soldering The Experience of the Japanese Electronics Industry

With the US military now committed to the phasing out of lead-containing solders via the Joint Group on Pollution Prevention (JG-PP) the electronics industry has moved beyond debate about wheth .. read more
Author(s)
Tetsuro Nishimura,Keith Sweatman
Event
IPC APEX 2003

Robust Optimization of a Lead Free SMT Process

This paper will focus on Dr. Taguchi’s Robust Engineering methodology,measurement methods and experimental results for the optimization of a lead free SMT process for use in an Automotive Elect .. read more
Author(s)
Craig Jensen,Fred Kuhlman,Mike Pepples
Event
IPC APEX 2003

Reduction of Hazardous Substances vs. Recycling

Much of the environmental emphasis is currently on elimination of undesirable elements and compounds such as lead or halogens. The unintended consequences are huge in terms of diversion of reso .. read more
Author(s)
Alan Rae
Event
IPC APEX 2003

Assessing Circuit Pack Design and Assembly for Environmental Performance and Sustainability

Circuit pack assembly involves the use of numerous materials and processes of environmental concern,including electronic components and associated assembly operations. It is necessary to be abl .. read more
Author(s)
David A. Dickinson,Thomas A. Okrasinski,Frederick M. Blechinger,Bryan K. Stolte
Event
IPC APEX 2003

Life-Cycle Comparison of Energy Use during the Application of Lead-Free Solders

The energy consumed during the reflow assembly of printed wiring board assemblies is expected to be environmentally significant within the solder product life-cycle. Wide differences in the mel .. read more
Author(s)
Jack Geibig,Maria Socolof,Prawin Paulraj,Todd Brady
Event
IPC APEX 2003

Solder Joint Thermal Fatigue Damage Evaluation by a Simplified Method

In the present study,a simplified analysis methodology is used to evaluate thermal fatigue damage of solder joints of a leadless ceramic chip carrier (LCCC) or a leadless chip capacitor/resisto .. read more
Author(s)
T. Eric Wong,Carlene Y. Lau,Polwin C. Chan
Event
IPC APEX 2003

An Efficient Test Model to Study the Board Level Reliability For High I/O Flip Chip BGA Packages

With the increasing demands of complex functions in a single chipset or microprocessor,the development of large size high I/O Flip Chip BGA (FCBGA) package becomes very important in recent year .. read more
Author(s)
Y.S. Chen,C.S. Wang,Tom Liou,A.C. Shiah
Event
IPC APEX 2003

Solderability Testing Methodologies for BGA Packages

Solderability testing is carried out at the IC (Integrated Circuit) manufacturer’s end to evaluate the quality of the IC package terminals in terms of solder wetting ability. Current industrial .. read more
Author(s)
Nopphadol Kongtongnok
Event
IPC APEX 2003

Implementation of High I/O Count 1mm Pitch BGA Technology

Electronic package size reduction and demand for increased functions within less board space make a challenge for the PCB designer to find smaller footprint components that will out perform lar .. read more
Author(s)
Thomas Aherne,Marius Geurts,Loek Derks
Event
IPC APEX 2003

Board Level Interconnect Reliability Assessment of High I/O BGA Packages

To meet the complex design requirements of the electronics industry,there is an increased need for large size high I/O BGA packages. The size of these large BGA packages (up to 50 mm2 and 1157+ .. read more
Author(s)
Xiang Zhou,A.C. Shiah
Event
IPC APEX 2003

Mechanical Reliability of Fine Pitch Packages for use in Server and Mobile Electronic Packages

In both the server and portable electronic markets,monotonic mechanical overstress has become a primary issue in manufacturing and field usage. Appropriate test methods,including four point ben .. read more
Author(s)
Michael Brown,Dennis Krizman
Event
IPC APEX 2003

Selective Soldering Of Flexible Circuits Using Diode Lasers

The use of laser technology has found increasing applications in the electronics assembly industry. This non-contact heating technique is ideal for components that require careful handling whic .. read more
Author(s)
Prashant Chouta,Srinivasa Aravamudhan,Daryl Santos
Event
IPC APEX 2003

Robotic Selective Soldering,an Enabling Soldering Technique

Wave and reflow soldering are well known,successfully proven mass soldering techniques. They offer the ability to solder printed circuit boards in high volumes quickly with low defect levels,pr .. read more
Author(s)
Gerjan Diepstraten
Event
IPC APEX 2003

New Challenges in Selective Soldering

Current circuit board designs,particularly those in telecommunications,are so densely populated that they do not provide enough clearance between SMT components and through-hole components to a .. read more
Author(s)
Chrys Shea,Eric Becker
Event
IPC APEX 2003

SMT Rework Machines – Capability,Repeatability and Verification of In-Service Performance

SMT rework machines are vital tools to many production engineers. They can be used to correct process errors and repair test failures. They can also be used to service and upgrade products retu .. read more
Author(s)
Mike Hayward
Event
IPC APEX 2003

Flexible Rules Based Thermal Profiling for Surface Mount Rework

Surface Mount Rework systems have evolved into sophisticated thermal processing tools with the ability to accurately mimic original reflow oven profiles at a localized rework site. Features suc .. read more
Author(s)
Don Naugler,Harold Hyman,Terry Leahy
Event
IPC APEX 2003

Soldering Fluxes and the Repair Process

Wave soldering fluxes are currently used in hand soldering operations as a matter of course and with little regard for flux deposition amounts. This use has led to the investigation of fluxes u .. read more
Author(s)
Matthew Tuly,Laura J. Turbini,Thomas North,Bryce Watson,Jamie McIntyre
Event
IPC APEX 2003

A Self Assessment Software Tool for SMT Processes and Productivity Optimization

Numerous studies and anecdotal data suggest that most SMT assembly lines are not optimized. This situation is true whether one looks at the individual processes,such as stencil printing or plac .. read more
Author(s)
Ronald C. Lasky,Richard H. Short
Event
IPC APEX 2003

Using Heuristics to Identify Maverick Lots at In-Circuit Test

Yield and defect levels in the manufacturing of high-complexity and high-reliability Printed Circuit Board Assemblies (PCBAs) are extremely sensitive to variations in the process,component qual .. read more
Author(s)
Nathan Gnanasambandam,Robert Murcko,and K. Srihari,Vince Grebe,Michael Testani
Event
IPC APEX 2003

Lessons Learned from the IPC-2501 Testbed Prototype Performance Test at a Motorola Factory

The IPC 2501 Web Service Definition for the exchange of XML data provides an XML middleware integration environment that enables the deployment of IPC Computer Aided Manufacturing using XML (CA .. read more
Author(s)
Dan Pattyn,Michael Motherway
Event
IPC APEX 2003

PCB Equipment Communication Standards Today and Tomorrow

All manufacturers in the printed circuit board (PCB) industry have experienced lack of reliability,maintenance,and performance problems with their machines. These challenges decrease manufactur .. read more
Author(s)
Brian L. Rubow
Event
IPC APEX 2003

Advances in Shop Floor Equipment Communication Standards for Final Assembly and Packaging

The Final assembly and packaging area experiences similar integration issues as the Printed Wiring Board – PWB manufacturing industry. Communications between production equipment is based on di .. read more
Author(s)
Reijo Tuokko,Niko Siltala,Jose L. Martinez Lastra
Event
IPC APEX 2003

Recent Developments in MSD Control

This paper discusses some of the new challenges associated with MSD Control in PCB assembly plants and offers a solution to reduce manufacturing costs and improve quality by automating this cri .. read more
Author(s)
François Monette
Event
IPC APEX 2003