Welcome to IPC's collection of technical papers presented at conferences since 2002. You can search by author, title and keyword. You can also search for keywords and topics in the Tag field. Access to the papers is reserved for IPC members.

Use of Underfill to Enhance the Thermal Cycling Reliability of Small BGAs

Description In this work,we have evaluated the use of underfill to enhance the reliability of small BGAs in the automotive thermal cycling environment. Best parameters for underfilling of BGAs were developed during a processing study, ... read more
Author(s)
Jeffrey C. Suhling,R. Wayne Johnson,John L. Evans,Roy W. Knight,Nokibul Islam,Jing Liu,Shyam Gale,Yasser Elkady,James R. Thompson
Event
IPC APEX 2003

Capabilities of Tools Used to Measure Voids to Industry Standards

Description It is stated that some degree of voiding is acceptable and inevitable when soldering electronic components,and specifically BGAs. There have been many publications which discuss this phenomena,the reasons for,how to ... read more
Author(s)
Steve Harris,Harjinder Ladhar,Sundar Sethuraman
Event
IPC APEX 2003

Board Level Manufacturability and Reliability Assessment of 0.5 mm Wafer Level CSP with Over-Sized Balls

Description The endless quest for increased performance in less space has recently manifested itself in 0.5mm pitch Chip Scale Packages (CSP). The footprints of these packages are only about half the size that of a 0.8 mm-pitch CSP but they ... read more
Author(s)
A.C. Shiah,Xiang Zhou
Event
IPC APEX 2003

Printing and Profiling Fine Feature Devices

Description To characterize the paste printing process,both the individual aspects of the process and the interactions between the aspects must be understood. The main aspects of the printing process are paste,stencil,printer and board. Each can ... read more
Author(s)
Chrys Shea,Bruce Moloznik
Event
IPC APEX 2003

Avoiding the Solder Void

Description Solder voiding is present in the majority solder joints and is generally accepted when the voids are small and the total void content is minimal. X-ray methods are the predominate method for solder void analysis but this method ... read more
Author(s)
Richard Lathrop
Event
IPC APEX 2003

Characterization and Measurement of BGA Solder Joint Alloy Phase Solid State Thermal and Electromigration

Description A number of prior studies have established that solid state migration of solder alloy elemental phases will occur as a function of temperature,time and voltage bias through the solder joint. This study undertakes to develop and ... read more
Author(s)
G.R. Minogue,K. Tellefsen,P. Chouta
Event
IPC Printed Circuits Expo 2003

Lead-Free Wave Soldering – Tighter Process Windows Need Tighter Process Controls

Description Although wave soldering has not historically been considered a well-controlled process,its evolution over the past decade makes it a prime candidate for effective control methods. These methods are not complex,but relatively ... read more
Author(s)
Chrys Shea,Keith Howell
Event
IPC Printed Circuits Expo 2003

Micro Via Drilling Technology

Description Currently,PWB industry is striving for the cost down at the daily PWB manufacturing,and at the same time,they are developing the higher density PWB for the future application. ... read more
Author(s)
Yasushi Ito,Kiyoshi Yamaki,Akira Irie,Kunio Arai,Osamu Sekine,Jenny Tran
Event
IPC Fall Meetings 2003

Imprinted Interconnects Technology (I2T),a Revolutionary Method for the Production of Very-High-Density Interconnects (VHDI)

Description Today’s HDI field of technology is coming under more and more pressure to increase wiring density and,even more importantly,to decrease manufacturing costs. The current technological approach does not permit an adequate response to ... read more
Author(s)
Norbert Galster,Luca Baraldi
Event
IPC Fall Meetings 2003

JPCA Standards of Optoelectronic Assembly Technology

Description JPCA has been developing standards necessary for adoption of optoelectronic technology especially for consumer applications for years. The subjects being drafted are the technology that is fairly matured and actually used in some ... read more
Author(s)
Akikazu Shibata
Event
IPC Fall Meetings 2003

Copper Surface Treatment and Plating Reliability

Description Reliable copper interconnects are a primary requirement for most printed wiring board applications. A variety of wet manufacturing processes play an important role in the formation of durable interconnects,including plated thru ... read more
Author(s)
Jose A. Rios,Anita Sargent
Event
IPC Fall Meetings 2003

Methodology for High Aspect Ratio Pulse Plating

Description Two years ago when IBM Endicott,now Endicott Interconnect (EI),was preparing to install a new Acid Copper plating system,the Periodic Reverse Pulse (PRP) tanks installed at the end of the line were seen as a current density ... read more
Author(s)
Robert D. Edwards
Event
IPC Fall Meetings 2003

Cray X1: Extreme Performance Requires Extreme Reliability

Description The Cray X1™ system dramatically extends the capability of supercomputers with High efficiency and extreme performance. Specifically designed to meet the needs of the high-end user,the Cray X1 provides exceptional ... read more
Author(s)
Terry Fischer,Gary Purvis,Yoichi Daiko
Event
IPC Fall Meetings 2003

High Frequency Dielectric Constant and Dissipation Factor Performance of Electronic PWB Substrates

Description Design of printed wiring boards allowing devices to function at increasing signal transmission rates is a difficult task. As operating frequencies increase beyond one Gigahertz the availability and accuracy of Dielectric Constant and Dissipation ... read more
Author(s)
William Varnell,Anthony Bryan
Event
IPC Fall Meetings 2003

Propagation Delay Measurements with TDR in the Manufacturing Environment

Description This paper addresses the growing need in the Printed Wiring Board industry to measure and test propagation delay parameters of board interconnects within the fabrication process. The state of current art is detailed in discussions of four ... read more
Author(s)
Brian D. Butler
Event
IPC Fall Meetings 2003

Design of Optimized High Speed Circuits

Description Designing a signal path to provide a particular impedance is thought to be a well understood science. The first issue which is often overlooked is to analytically establish the need for specifying a controlled impedance signal path. After determining ... read more
Author(s)
J. Lee Parker,W. J. MacKillop
Event
IPC Fall Meetings 2003

Improving Oxide Resistance and Solderability of Electroplated Tin & Tin Alloy Coatings for Component Plating and Printed Circuit Board Final Finish Applications

Description Abstract Electroplated tin and tin alloy coatings are used in electronics plating applications as a solderable and corrosion resistant surface finish for components and printed circuit boards (PCBs). Though applications vary,there are some commonalities ... read more
Author(s)
Rob Schetty. Kilnam Hwang
Event
IPC Fall Meetings 2003

Effects of Lead-Free Surface Finishes on Press-Fit Connections

Description For decades,tin-lead has been used as the primary surface finish for compliant pins and plated through holes (PTH) of printed circuit board (PCB) in press-fit connections. Therefore,most test results on press-fit performance are focused on the ... read more
Author(s)
George J.S. Chou,Robert D. Hilty
Event
IPC Fall Meetings 2003

Establishing Component Traceability as an EMS Provider: A Mission Critical Service

Description As an EMS provider of high complexity backpanel assemblies,traceability of components with performance issues found at system test,functional test and in the field was limited to the ability to trace the raw board or fab defects and not much more. ... read more
Author(s)
Victor Barba,Vincent Grebe
Event
IPC Fall Meetings 2003

The Effect of Via-in-Pad Via-Fill on Solder Joint Void Formation

Description Fabricators,and the copper plating process they choose,can have considerable influence on their customers' solder joint reliability. In the case of high density assemblies,via-in-pad designs often cause solder joint void formation due to the ... read more
Author(s)
Adam Singer,Prashant Chouta,Eric Stafstrom,A. James McLenaghan,Guillermo Echeverria
Event
IPC Fall Meetings 2003

A Second Look At Injection Via Fill Process Capability,And Material Property Issues

Description In the United States,focus turns toward enabling technology for quick-turn printed circuit board and laminate package manufacturing. The current corporate mandate is to develop advanced,enabling technology,and to integrate it rapidly. ... read more
Author(s)
Jesse L. Pedigo
Event
IPC Fall Meetings 2003

Aerosol-Based Direct Writing of Interconnects

Description Optomec is developing an aerosol-based technology for high-precision,maskless deposition of a wide variety of materials. The system functions by atomizing commercial inks and pastes,and then depositing the droplets under ... read more
Author(s)
Michael J. Renn
Event
IPC Fall Meetings 2003

A Novel Build-up PWB for Latest Mobile Phone

Description x ... read more
Author(s)
Kotaro Takahashi
Event
IPC Fall Meetings 2003

3-D Packaging: Innovative Solutions for Multiple Die Applications

Description A vertically configured package technology developed by Tessera is proving to be a practical multi-die solution for any number of single and multiple functional combinations. The enabling technology for this stacking approach allows different ... read more
Author(s)
Vern Solberg
Event
IPC Fall Meetings 2003

Three-Dimensional System-in-Package (3D-SiP) in Japan: The Second Stage of Development

Description The adoption of three-dimensional System-in-Package (3D-SiP) is progressing rapidly,driven primarily my mobile electronic applications such as mobile phones,PDAs,digital still cameras,and digital video recorders. The underlying,enabling Chip ... read more
Author(s)
Morihiro Kada
Event
IPC Fall Meetings 2003

Buried Capacitance and the Evolution of Thin Laminates

Description Buried Capacitance1 (BC) laminates products have been in use in many high-speed applications for more than ten years. BC products are a significant contributor to complex multi-layer printed circuit board construction and also a ... read more
Author(s)
Nicholas Biunno,Greg Schroeder,Howard Jones,John Andersakis
Event
IPC Fall Meetings 2003

Stress Effects on Thin Film Nichrome Embedded Resistor Tolerance

Description Electronic devices with high performance are becoming smaller and lighter. The passive components required to enable high performance consume premium space on the surface of the printed circuit board. Integrating the resistor ... read more
Author(s)
Jiangtao Wang,Rocky Hilburn,Sid Clouser
Event
IPC Fall Meetings 2003

Size and Cost Modeling for Embedded Passives

Description Lower cost is frequently listed as the main driver for moving to embedded passives. Unfortunately,understanding the true cost difference between a design using embedded passives and the same design using discrete passives is ... read more
Author(s)
Chet Palesko,Leonard Roach
Event
IPC Fall Meetings 2003

Designing Ceramic Thick-Film Capacitors for Embedding in Printed Circuit Boards

Description This paper presents an emerging technology for embedding discrete ceramic thick-film capacitors directly into printed circuit boards. Their use frees up surface real estate allowing for smaller boards and/or for more silicon on ... read more
Author(s)
Richard Snogren
Event
IPC Fall Meetings 2003

Decoupling with Integrated Capacitors

Description Successive generations of ICs demand higher peak current levels and faster current rise times,challenging traditional surface mount decoupling. The considerably lower parasitic inductance of integrated capacitors and the structures associated with ... read more
Author(s)
Richard Ulrich,Leonard Schaper
Event
IPC Fall Meetings 2003

Enhanced Embedded Passives Technology – From Distributed to Discrete

Description Embedded passives are entering a new phase of improved product capability and enhanced processes. Thinner, higher capacitance embedded distributed capacitance (EDC) materials are coming to market. Alternate resistor ... read more
Author(s)
Douglas W. Trobough,Bob Greenlee
Event
IPC Fall Meetings 2003

What’s Wrong With My Surface Finish? An Evaluation of the Limitations of Common Surface Finishes

Description This paper will highlight the shortcomings of each of the commonly used surface finishes available on the market today. The goal is to spark the industry interest,that it may double its efforts in resolving the technical issues ... read more
Author(s)
Mike Barbetta
Event
IPC Fall Meetings 2003

Immersion Silver and Immersion Tin IPC Plating Committee 4-14 Industry Update

Description The development of two new industry specifications – IPC-4553 (immersion silver IAg) and IPC-4554 (immersion tin ISn) are well under way. Following in a tradition started with the development of the 4552 ENIG specification,it is customary for ... read more
Author(s)
Gerard O’Brien,George Milad
Event
IPC Fall Meetings 2003

Solderability of Sn/Cu Lead-Free Solder as a HASL Bare Board Final Finish

Description Sn/Cu lead-free solder is a good alternative to 63/37 solder for use in HASL processes. Solderability of Sn/Cu surface exceeds that of 63/37 solder,nickel-gold,OSP,silver,and immersion tin both before and after heat induced aging. ... read more
Author(s)
Tony Lentz,Thomas Scimeca
Event
IPC Fall Meetings 2003

The Study,Measurement,and Prevention of Tarnish on Immersion Silver Board Finishes

Description With increased environmental legislation against lead in the electronics industry1,circuit board manufacturers are expecting chemical suppliers to formulate lead free alternatives with the same functionality as tin/lead. These ... read more
Author(s)
Lenora Toscano,Donald Cullen
Event
IPC Fall Meetings 2003

Galvanic Compatibility of Immersion Gold and Immersion Silver Printed Wiring Board Finishes with Aluminum

Description Numerous industry studies have been performed examining the compatibility between new plating finishes and other metals used in printed wiring assemblies. The transition to the new printed wiring board finishes has been driven by global lead-free ... read more
Author(s)
David Hillman,Matt Hamand
Event
IPC Fall Meetings 2003

Challenges in Bare Die Mounting

Description Traditionally,the evolution of advanced IC assemblies has been due to defense and aerospace applications,where reliability,size and weight were at a premium,and cost was a secondary consideration. In the 1980’s,high ... read more
Author(s)
Larry Gilg
Event
IPC Fall Meetings 2003

ovhm technology

Description x ... read more
Author(s)
Bob Mazuik
Event
IPC Fall Meetings 2003

Integration of AOI in a Total Quality Management Program

Description x ... read more
Author(s)
Matthew T. Holzmann
Event
IPC Fall Meetings 2003

Design for manufacture and inspection

Description x ... read more
Author(s)
Duncan Nicol
Event
IPC Fall Meetings 2003

AOI for NPI and Process Control

Description x ... read more
Author(s)
x
Event
IPC Fall Meetings 2003

A Case Study of an OEM's Program to Assess Supplier Capabilities,Technology Availability,and Reliability for Advanced Printed Circuit Boards

Description Teradyne,Inc. has been involved with Conductor Analysis Technologies,Inc. (CAT Inc.) for over 4 years and the IPC D-36 Subcommittee for over 2 years. This paper describes the initial motivation for selecting "CAT" test ... read more
Author(s)
David Evans,Valerie St.Cyr
Event
IPC Fall Meetings 2003

Optimized System Design Through Industry Benchmarking of Fabrication Tolerances and Material Properties

Description Benchmarking of industry fabrication capability,feature tolerances and material property variation is essential to aligning product requirements and industry capability. Statistical based characterization of feature tolerances and ... read more
Author(s)
Gary Brist,Gary Long,Daryl Sato
Event
IPC Fall Meetings 2003

Cost-Effective Placement Machine Capability Analysis and Process Control

Description New component packaging formats create the need for greater production process stability,reproducibility and precision. This leads to a growing demand for process control solutions. ... read more
Author(s)
Christoph Torbohm
Event
IPC Fall Meetings 2003

Flip Chip Processing Solutions as used in System in Package Applications

Description Dramatic changes are underway in the computer,telecommunication,automotive,and consumer electronics industries. Changes that demand common and pervasive requirements for active assemblies such as: (1) ultra-low ... read more
Author(s)
Brian J. Lewis,Paul N. Houston,Daniel F. Baldwin
Event
IPC Printed Circuits Expo 2003

The Formal Development of a Pb-Free Electronics Manufacturing Operation

Description To successfully navigate the transition from an entrenched Pb-based electronics manufacturing model to a fully integrated Pb-free manufacturing operation will require significant and coordinated modifications to many elements of currently operating electronics manufacturing organizations. ... read more
Author(s)
Eugene A. Smelik,James McLenaghan,Joe Belmonte
Event
IPC APEX 2002

Factors Influencing the Optical Performances of Fiber Optic Connectors

Description Optical connectors are used to connect optical devices to other optical devices or systems. The presence of these optical connectors makes it possible to switch conveniently from one device or system to another. ... read more
Author(s)
Jennifer Nguyen
Event
IPC APEX 2002

Evaluation of Two Novel Lead-Free Surface Finishes

Description Two new electrolytically plated lead-free surface finishes,satin bright tin on nickel and palladium-cobalt on nickel followed by gold flash coating,are evaluated for their wettability,bond strength,and voiding performance,and are compared with electrolytic nickel gold and OSP. ... read more
Author(s)
Richard Ludwig Ph.D.,Ning-Cheng Lee Ph.D.,Chonglun Fan Ph.D.,Yun Zhang Ph.D.
Event
IPC APEX 2002

Evaluation of the Comparative Solderability of Lead-free Solders in Nitrogen

Description Lead-free soldering technology is still in its infancy with technical and cost issues posing major challenges for the industry. ... read more
Author(s)
Christopher Hunt,Deborah Lea,Sean M. Adams,Paul F. Stratton
Event
IPC APEX 2002