HDI Training & Implementation at Eagle Test Systems
Eagle Test Systems (ETS) a Teradyne Company established a team during 2009 to develop a training exercise that would bring High Density Interconnect (HDI) knowledge to new products. A digital m
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Event
IPC Midwest 2010
Addressing the Challenge of Head-in-Pillow Defects in Electronics Assembly
The head-in-pillow defect has become a relatively common failure mode in the industry since the implementation of Pb-free technologies,generating much concern. A head-in-pillow defect is the in
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Event
IPC Midwest 2010
Void or Not to Void
- Background: What is a void?
- What is a "macro" void?
- What is a “planar” void?
- What is a “shrinkage” void?
- What is a “microvia” void?
- What is a “pinhole” void?
- What is a “Kirkendall
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Event
IPC Midwest 2010
Drop Testing of a Pb-Free Board after Assembly and SnPb-Rework
•Board-level drop shock test was performed on 9 assemblies
–63 parts / board
–Parts representative of military package styles
•Assembled on Pb-free compatible laminate with SAC 305 solder
•Sele
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Event
IPC Midwest 2010
Management and Mitigation of Tin Whiskers for Lead-Free Electronics
The lead-free directive from the EU has created a number of challenges for high reliability electronic applications. Key among those challenges is the need to address the issue of tin whiskers.
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Event
IPC Midwest 2010
Improving Tin Whisker Testing through Quantitative Measurements of Plated Film Properties
- Correlating film properties to the propensity to whisker will lead to the development of a comprehensive whisker growth model and create successful mitigation strategies.
•Hillock and whisker
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Event
IPC Midwest 2010
Leveraging IPC 1752 for Product Lifecycle Analytics
- Regulations are driving increasing IPC-1752 use
- More restricted substances and product categories in scope
- The business challenge is much bigger than “regulatory compliance”
- Teams incre
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Event
IPC Midwest 2010
Reliability and Quality Planning in the Product Development Cycle
In globally competitive markets,managing product quality,reliability and risk is not an option. However,it also brings its own unique set of challenges to complex organizations:
- Product desig
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Event
IPC Midwest 2010
Effects of Nano-Tio2 Particles Additions on Microstructure Development And Hardness of Sn3.5Ag0.5Cu Composite Solder
The effects of nano-TiO particle additives on the microstructure and microhardness of the 2 Sn3.5Ag0.5Cu composite solder were studied. Results show that alloying with nano-TiO 2 particles dram
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Event
IPC Midwest 2010
Tin Corrosion under QFN Packages at Elevated Temperature and Humidity
Using X-ray imaging,solder corrosion,resembling metal migration,had been observed under QFN (Quad Flat No-Lead package) devices and chip resistors on circuit boards that were processed with two
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Event
IPC Midwest 2010
Analytical Procedures for Portable Lead-Free Alloy Test Data
• Genesis in December 2008
• Follow-up discussions APEX 2009
• Input received from SMEs
• Conference Call July 22,2009
• Discussions IPC Midwest 2009
• First white paper issued by IPC SPVC June
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Event
IPC Midwest 2010
ESD Control for the Automotive Electronics Industry
Like many other electronics industries,the automotive electronics industry has long been concerned about ESD. As dramatically seen in the news today,quality recalls can detrimentally affect the
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Event
IPC Midwest 2010
Strategies for the Prevention of Board Strain and Cracked Chips in Automotive Electronics
BGA’s,ceramic capacitors,and similar strain sensitive components are used extensively throughout the automotive and consumer electronics industries. Unfortunately these components can be easily
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Event
IPC Midwest 2010
Reliable Solder Identification by X-ray Fluorescence Spectroscopy
High reliability applications in the military and aerospace industry require reliable solder finish
identification on components within the supply system of DoD,NASA,and many other organization
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Event
IPC Midwest 2010
Design for Reliability: The Next Generation
As margins on electronics technology have continued to erode,an increasing number of organizations have implemented design for reliability practices to ensure device performance while meeting t
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Event
IPC Midwest 2010
Die Attach Solder Materials and Application Technology
Advancing technology frequently requires an accompanying advancement in materials technology. Recently,these advances are also driven by changes in environmental legislation as well. Specifical
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Event
IPC Midwest 2010
Integrating Cleaning Equipment and Cleaning Agent for Maximum Performance
The growing complexity of electronic assemblies increases the cleaning challenge due to miniaturization,lower component gaps,and improved flux designs. The need to remove ionizable contaminants
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Event
IPC Midwest 2010
An Investigation into Hand Sanitizers and Hand Lotions and Potential Risks to High Performance Electronics
As people become more concerned about the global outbreaks of various strains of influenza,more precautions are being taken with respect to personal hygiene. A common precaution involves the us
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Event
IPC Midwest 2010
Understanding Cleanliness and Methods of Determination
Several methods exist to determine cleanliness of printed wiring assemblies. This presentation will describe the common methods used for determining cleanliness of printed wiring assemblies. Th
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Event
IPC Midwest 2010
Production of Flexible Circuits in Reel to Reel Horizontal Production Systems
Reel to reel production of flexible circuits where the substrate consists of a continuous roll is a technique commonly used in mass production. This method is an obvious solution for efficient
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Event
IPC APEX EXPO 2010
A New System for Automatically Registering and Exposing Solder Mask and Other Photopolymeric Materials Requiring High Energy Lamp Sources
An overview of previous work regarding light enegine development is provided,proceeded by an in-depth overview of new technology available for solder mask imaging.
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Event
IPC APEX EXPO 2010
Toughened Laminates for Printed Circuit Boards: Correlation of Drillability to Material Properties
With the miniaturization of electronic devices1,the need for more versatile materials to make these devices increases. Coupled with the gradual removal of lead-based solders2,thermal stability
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Event
IPC APEX EXPO 2010
Lead-Free Flux Technology and Influence on Cleaning
Lead-free flux technology for electronic industry is mainly driven by high soldering temperature,high alloy surface tension, miniaturization,air soldering due to low cost consideration,and envi
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Event
IPC APEX EXPO 2010
Selecting Cleaning Processes for Electronics Defluxing: Total Cost of Ownership
Electronics manufacturing process engineers are faced with significant challenges when selecting a cleaning system as a
consequence of the wide ranges of cleaning processes and equipment. Curre
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Event
IPC APEX EXPO 2010
Validity of the IPC R.O.S.E. Method 2.3.25 Researched
Miniaturization and higher functionality in electronics packaging require the use of advanced packages and small components. This trend has translated into the use of new package types such as
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Event
IPC APEX EXPO 2010
The Use of Inkjet Printing Technology for Fabricating Electronic Circuits – The Promise and the Practical
Manufacturers of electronic devices are always searching for new technologies that can improve processes,extend capabilities and lower costs. These drivers,along with the needs of new markets l
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Event
IPC APEX EXPO 2010
Industrial PCB Development using Embedded Passive & Active Discrete Chips Focused on Process and DfR
For several years,3D-integration approaches have been explored to keep pace with the continuous trends towards electronics
miniaturization and densification. Numerous technologies issued from v
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Event
IPC APEX EXPO 2010
A Novel Primer Coating on Organic Substrate for Reliable Inkjet Printed Circuit
Even though ink jet printed circuit has many advantages over typical subtractive PWB technology such as fewer processes,less waste and labor,it has some problems. A major problem is weak adhesi
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Event
IPC APEX EXPO 2010
PCB Design and Assembly for Flip-Chip and Die Size CSP
As new generations of electronic products emerge they often surpass the capability of existing packaging and interconnection technology and the infrastructure needed to support newer technologi
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Event
IPC APEX EXPO 2010
The Universal PCB Design Grid System
Mixing PCB Design Layout units will compromise perfection every time. PCB Design perfection starts with building CAD
library parts and quickly moves to part placement,via fanout and trace routi
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Event
IPC APEX EXPO 2010
A Strategy for Via Connections in Embedded Sheet Capacitance Designs
Predicting the electrical performance of embedded capacitor PCB designs has been a major stumbling block for the technology. In particular,one of the key questions has been how quickly can char
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Event
IPC APEX EXPO 2010
Filling in the Gaps in Lead-Free Reliability Modeling and Testing
This presentation discusses critical material properties and test data that are often overlooked in the introduction of new lead-free solder alloys,but are critical to alloy comparison and the
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Event
IPC APEX EXPO 2010
Solder Creep-Fatigue Model Parameters for SAC & SnAg Lead-Free Solder Joint Reliability Estimation
For many of the Pb-free solders required under the European RoHS directive,there is now sufficient information,primarily in the form of the results of accelerated thermal cycling of various lev
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Event
IPC APEX EXPO 2010
Nanotechnology for Lead-Free PWB Final Finishes with Organic Metal
The use of an Organic Metal finish only a few nano-meters deposited onto copper pads of printed circuit boards provides effective protection against oxidation and preserves solderability. The N
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Event
IPC APEX EXPO 2010
Comparison of the Electrochemical and Physical Properties of Nanocrystalline Copper Deposition in the Fabrication of Printed Wiring Boards
Typical electrodeposition of conventional metals produces deposits that are polycrystalline in nature,comprised of many crystal grains separated by grain boundaries. Adding grain refiners to a
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Event
IPC APEX EXPO 2010
Chemical “Kick Start” for the Autocatalytic Formaldehyde-Free Electroless Copper Plating Process
The present work describes the use of additives in formaldehyde-free copper solutions to improve the start reaction of
electroless copper deposition.
Conventional electroless copper plating sol
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Event
IPC APEX EXPO 2010
OA Flux Cleaning Studies on Highly Dense Advanced Packages Parameters
Cleaning flux residues post soldering has been a high reliability criterion practiced by assemblers of military,aerospace,automotive,medical devices and other value offerings. Highly dense adva
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Event
IPC APEX EXPO 2010
Case Study – “Limitations of DI-Water Cleaning Processes”
While most cleaning processes in the global electronics manufacturing industry still rely on cleaning with DI-water only (for OA flux removal),recent studies suggest that water is beginning to
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Event
IPC APEX EXPO 2010
Cleanliness of Stencils and Cleaned Misprinted Circuit Boards
The effectiveness of cleaning stencils and misprinted/dirty printed circuit boards can be effectively monitored. This can be done by washing known clean circuit boards and then checking to see
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Event
IPC APEX EXPO 2010
Robust Automated Void Detection in Solder Balls and Joints
Accuracy in solder balls and joint void detection is very important. If voids are incorrectly identified,board yield will be affected by incorrect scrapping and rework. Voids are difficult to d
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Event
IPC APEX EXPO 2010
Advances in Automatic Monitoring of Stencil Printing Processes
The electronics assembly industry has long wished for and made great advancements toward developing a true,closed-loop automatic print verification and process monitoring technology. While sign
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Event
IPC APEX EXPO 2010
Zoom Fixtures for ATE
This paper details a break-through technology for automatic test equipment (ATE) fixtures. These new fixtures address the current market needs of - "faster,cheaper,and smaller". The new fixture
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Event
IPC APEX EXPO 2010
Investigation of Process Feasibility / Compatibility and Solder Joint Reliability of Tin-Lead Dippable Solder Paste Ball Grid Array (BGA) Component Rework/Repair
This paper is an examination of the process feasibility,solder joint reliability,and materials/process compatibility of a dippable solder paste material for an area array component rework/repai
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Event
IPC APEX EXPO 2010
NASA-DoD Lead-Free Electronics Project: Mechanical Shock Test
Mechanical shock testing was conducted by Boeing Research and Technology (Seattle) for the NASA-DoD Lead-Free Electronics Solder Project. This project is follow-on to the Joint Council on Aging
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Event
IPC APEX EXPO 2010
Copper Tin Intermetallic Crystals and Their Role in the Formation of Microbridges between the Leads of Hand Reworked Fine Pitch Components
Wave soldering is a mature manufacturing process that metallurgically joins component and PWB termination features by
passing them together across the flowing surface of a molten solder reservo
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Event
IPC APEX EXPO 2010
Counterfeit Electronics:Strategies for Fighting Counterfeit Electronics
•Background information
•Scope of the problem
–Anecdotal
–Study by International Chamber of Commerce
–Recent study US Dept of Commerce
•What to do about it ?
–“Findings” and “Best Practices”
•T
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Event
IPC APEX EXPO 2010
Real or Fake? The Counterfeit Chip Conundrum
Counterfeiting is clearly a growing problem in many industries,including electronics,around the world. As the financial impact of counterfeiting has grown over the years,so has the attention th
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Event
IPC APEX EXPO 2010
Conformal Coatings for Tin Whisker Risk Management
The objective of this study is to evaluate conformal coatings for mitigation of tin whisker growth. The conformal coatings chosen for the experiment are acrylic,polyurethane and parylene. The c
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Event
IPC APEX EXPO 2010
Effect of Soldering Method,Temperature,and Humidity on Whisker Growth in the Presence of Flux Residues
Since the electronics industry moved to lead-free solders that typically have a tin content of more than 95% there has been
concern about the possibility of circuit malfunctions due to whisker
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Event
IPC APEX EXPO 2010