D-32 Thermal Stress Test Methodology Subcommittee

Chair James Monarchio, TTM Technologies
Vice Chair Jerry Magera, Motorola Solutions
Vice Chair Jose Rios, Raytheon
Staff Liaison
Committee Charter This subcommittee is responsible for developing and maintaining test protocols for assessing the reliability and material/design robustness of test coupons/vehicles through the use of thermal profiles. This will aid in establishing the acceptability of a printed board exposed to multiple thermal cycles in both tin-lead and lead-free processing environments.
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