IPC Day The Netherlands | 6 December 2018, Den Bosch, NL

Understanding Failures for Improved Reliability

On Thursday, 6 December 2018, 25 European IPC members and PCB professionals convened in Den Bosch, NL to take part in IPC Day The Netherlands, and to hear a keynote presentation on “Understanding Failures for Improved Reliability” by Mr. Bhanu Sood from NASA Goddard Space Flight Center. During this one-day gathering, IPC offered unique insight from outstanding industry experts and provided quality expertise and information as well as networking opportunities to participants (including 23 companies and two IPC and partner representatives)

During his welcome address, Rob Walls, PIEK Triainingen director, pointed out current industry challenges and solutions availble through IPC standards and certification programs. He briefly described a wide range of solutions offered by PIEK both in the Netherlands and abroad.

Philippe Léonard, IPC Europe director, welcomed all participants, speakers and partners and briefly presented IPC plans for European activities, including upcoming events for next year, IPC Hand Soldering Competition and the recently initiated IPC project on workforce shortage JTA (Job Task Analysis).

Keynote speaker Bhanu Sood defined how NASA approaches a mission’s environment and associated risks. He explained that risk is defined as an expectation of loss in statistical terms. He described that “risk is a combination of a consequence and a likelihood.” He described his risk-based approach to printed circuit board assurance and disposition of nonconformance on standards. He used a supplier case study to illustrate the use of the risk-based approaches and the need for proper interpretation of nonconformances in the context of mission’s risks (reject, non-conformance, failure). Bhanu mentioned that “risk occurrence can turn into technical, resulting in performance degradation, cost or schedule impact or even safety issues, which is definitely the one that has to be absolutely avoided.”

Bhanu explained that standards provide data points that can serve to reduce either the occurrence or the consequence of error. Talking about “expectation of loss in a quantifiable manner,” he told the audience that “there is often a tendency to take action to eliminate severe consequences regardless of the probability of occurrence, which relative to the mission might not always be appropriate.” He concluded by stating his definition of risks to balance “low probability with high consequences” vs. “high probability/high occurrence with low consequences.” 

All IPC Day participants gained valuable technical knowledge and enjoyed a very interesting networking session with peers and industry experts.

The Keynote Speaker
Bhanu Sood is a Commodity Risk Assessment Engineer at NASA Goddard Space Flight Center. Mr. Sood serves as the Goddard Center lead and NASA Specialist managing overall development efforts pertaining to risk and reliability of Microelectronics Packaging and Printed Circuit Boards used in NASA Goddard’s flight missions and ground support equipment. Prior to joining NASA, Mr. Sood was the Laboratory Director at University of Maryland’s Center for Advanced Life Cycle Engineering (CALCE). He holds two patents, an invention disclosure and is the author of several hundred conference papers, presentations and technical reports, four book chapters and thirty-two peer reviewed scholarly and technical manuscripts..

Our Partner
PIEK Trainingenis a fully accredited IPC certification centre presenting CIT (trainer level) and CIS (Operator level) training courses, based in Heerlen, The Netherlands, and active in multiple locations across Europe.  Fully independent, PIEK provides in-house (Heerlen) and on-site trainings (at customer location), which can be customised to meet specific customer needs.