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Rescheduled for February 2011. Please check back for new dates.
Hunter Technology Corp,
2921 Corvin Drive
Santa Clara, Calif.
Instructor: Cheryl Tulkoff, Senior Member of the Technical Staff, DfR Solutions
This session addresses potential reliability issues within lead-free processes, current state of industry knowledge and risk mitigation based on product design, materials, complexity, volumes and customer expectations of reliability. The session summary includes a roadmap for ensuring the reliability of lead-free product.
This presentation provides a focused but comprehensive discussion on potential reliability issues that can arise within lead-free processes. All areas of potential risk are examined. For each reliability concern, a brief description is provided, followed by the current state of industry knowledge and an opportunity for risk mitigation based upon the product design, materials, complexity, volumes, and customer expectations of reliability. A final summary provides the attendees a roadmap for ensuring the reliability of lead-free product.
What you will learn:
Refresher:
- SAC background & alternative alloys
- The Current State of Lead Free:
- PCBs
- Components
- Solders
- Wave and Rework
- Reliability
About the Instructor:
Cheryl Tulkoff has over 15 years of experience in electronics manufacturing with an emphasis on failure analysis and reliability. She has worked throughout the electronics manufacturing life cycle beginning with semiconductor fabrication processes, into printed circuit board fabrication and assembly, through functional and reliability testing, and culminating in the analysis and evaluation of field returns. She has also managed no clean and RoHS-compliant conversion programs and has developed and managed comprehensive reliability programs.
Tulkoff earned her bachelor of mechanical engineering degree from Georgia Tech. She is a published author, experienced public speaker and trainer and a senior member of both ASQ and IEEE. She holds leadership positions in the IEEE Central Texas Chapter, IEEE WIE (Women In Engineering), and IEEE ASTR (Accelerated Stress Testing and Reliability). She chaired the annual IEEE ASTR workshop for four years and is also an ASQ Certified Reliability Engineer.
She has a strong passion for pre-college STEM (Science, Technology, Engineering, and Math) outreach and volunteers with several organizations that specialize in encouraging pre-college students to pursue careers in these fields.
Register Today: $400 members/ $500 nonmembers
Notify me when registration becomes available.
Join our host for a facility tour!
A complimentary facility tour will follow lunch at 12:30 p.m. for those who wish to participate. Per ITAR regulations please bring government issued ID such as a passport or drivers’ license in order to participate in the tour. Foreign nationals from proscribed countries will not be allowed to tour the facility.
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