Projection Moiré vs. Shadow Moiré for Warpage Measurement and Failure Analysis of Advanced Packages

Description There are three key industry trends that are driving the need for temperature-dependent warpage measurement: the trend toward finer-pitch devices,the emergence of lead-free processing,and changes in device form factors. ... read more
Author(s)
Joe Thomas
Event
IPC APEX EXPO 2012

Warpage Issues and Assembly Challenges Using Coreless Package Substrate

Description Coreless technology in package substrate has been developed to satisfy the increasing demand of lighter,smaller and superior electrical performance regarding as the future trend in electronic application. ... read more
Author(s)
Jinho Kim,Seokkyu Lee,Jaejun Lee,Seungwon Jung,Changsup Ryu
Event
IPC APEX EXPO 2012

Reliability of Lead-Free LGAs and BGAs: Effects of Solder Joint Size,Cyclic Strain and Microstructure

Description An accelerated thermal cycle experiment comparing similarly constructed area array devices representing Land Grid Array ... read more
Author(s)
Denis Barbini,Michael Meilunas
Event
IPC APEX EXPO 2013

An Investigation into the Predictability of PCB Coplanarity for Room vs. Lead Free Assembly Temperatures

Description With the advent of larger packages and higher densities/pitch the Industry has been concerned with the co -planarity of both the substrate package and the PCB motherboard. The iNEMI PCB Co-Planarity Working group generated a snapshot in time ... read more
Author(s)
John Davignon,Ken Chiavone,Jiahui Pan,James Henzi,David Mendez,Ron Kulterman
Event
IPC APEX EXPO 2012

Introduction to Head-in-Pillow Defects

Description #NAME? ... read more
Author(s)
Guhan Subbarayan
Event
IPC APEX EXPO 2011