Influence of Microstructure on Mechanical Behavior of Bi-Containing Pb-Free Solders

Description SAC-Bi and Sn-Ag-Bi alloys have demonstrated superior performance in thermal cycling reliability tests of printed circuit boards,such as the National Center for Manufacturing Sciences programs in the 1990’s and the JCAA-JGPP program of the early 2000’s. ... read more
Author(s)
David B. Witkin
Event
IPC APEX EXPO 2013

Application of Thermal Analysis Techniques to Determine Performance Entitlement of Base Materials through Assembly

Description Multiple soldering assembly steps are essentially standard for PWBs based on current technologies and needs. A variety of tests are currently in use to evaluate the performance of finished PWBs,and indirectly,the materials and material performance of ... read more
Author(s)
Erik J. Bergum
Event
IPC Printed Circuits Expo 2003

Use of Lead-Free Laminate DMA and TMA Data to Develop Stress versus Temperature Relationships for Predicting Plated Hole Reliability

Description Accelerated testing of plated hole life is necessary for economic reasons due to the long time to failure during field operating conditions. One difficulty in performing accelerated testing on plated holes is to decide which acceleration model to use. ... read more
Author(s)
Michael Freda,James Frei,Jing Shi,Leoncio Lopez
Event
IPC APEX EXPO 2011